Editorial

Mauro Ciappa^*, Paolo Cova, Francesco Iannuzzo, Gaudenzio Meneghesso

^*Corresponding author for this work

Research output: Contribution to journal › Journal article › Research › peer-review

Original language	English
Journal	Microelectronics Reliability
Volume	52
Issue number	9-10
Pages (from-to)	1751-1752
Number of pages	2
ISSN	0026-2714
DOIs	https://doi.org/10.1016/j.microrel.2012.09.004
Publication status	Published - 1 Sept 2012
Externally published	Yes

Access to Document

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title = "Editorial",

author = "Mauro Ciappa and Paolo Cova and Francesco Iannuzzo and Gaudenzio Meneghesso",

year = "2012",

month = sep,

day = "1",

doi = "10.1016/j.microrel.2012.09.004",

language = "English",

volume = "52",

pages = "1751--1752",

journal = "Microelectronics Reliability",

issn = "0026-2714",

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}

TY - JOUR

T1 - Editorial

AU - Ciappa, Mauro

AU - Cova, Paolo

AU - Iannuzzo, Francesco

AU - Meneghesso, Gaudenzio

PY - 2012/9/1

Y1 - 2012/9/1

U2 - 10.1016/j.microrel.2012.09.004

DO - 10.1016/j.microrel.2012.09.004

M3 - Journal article

AN - SCOPUS:84866722609

SN - 0026-2714

VL - 52

SP - 1751

EP - 1752

JO - Microelectronics Reliability

JF - Microelectronics Reliability

IS - 9-10

ER -