Effect of thermal loading definitions on the mission profile-based reliability evaluation of power devices in PV inverters

Taerim Ryu, Ui-Min Choi*, Ionut Vernica, Frede Blaabjerg

*Corresponding author for this work

Research output: Contribution to journalJournal articleResearchpeer-review

4 Citations (Scopus)
7 Downloads (Pure)

Abstract

The long-term mission profile-based lifetime evaluation of a PV inverter plays an important role in the Design for Reliability approach to ensure the required reliability performance. In previous studies, different thermal loading definitions have been considered for the mission profile-based lifetime estimation of power devices. It may affect the reliability prediction result considerably but its impact has not yet been studied. In this paper, the effect of thermal loading definitions on the predicted reliability of power devices in a PV inverter is investigated. The thermal loadings and reliability of power devices of a single-phase five-level T-type inverter by considering four different thermal loading definitions are comparatively analyzed and further discussed. Finally, some guidelines for selecting the thermal loading definition are suggested.
Original languageEnglish
Article number114650
JournalMicroelectronics Reliability
Volume138
Pages (from-to)1-5
Number of pages5
ISSN0026-2714
DOIs
Publication statusPublished - Nov 2022

Keywords

  • Design for Reliability
  • PV inverter
  • Reliability
  • Power device
  • NPC inverter
  • Lifetime

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