Electronic properties of thin films sublimed from La@C82 and Li@C60

Vladimir Popok, A.V. Gromov, Martin Jonsson, A. Taninaka, H. Shinohara, Eleanor E.B. Campbell

Research output: Contribution to journalJournal articleResearchpeer-review

3 Citations (Scopus)

Abstract

La@C82 and Li@C60 thin films are studied using four-probe current-voltage measurements and atomic force microscopy. In situ electrical measurements show semiconducting behaviour of both films with room-temperature resistivity of 21+-8 and 1230+-50 Ohm.cm for the La@C82 and Li@C60, respectively. A variable range hopping mechanism of conductance is suggested from the temperature dependences of resistance. The activation energies for electron transport are calculated for both metallofullerenes. Irreversible changes to the Li@C60 film structure increasing the film resistivity to values typical for C60 are found at elevated temperatures. The effect of exposure to ambient atmosphere on the conductance of the films is discussed.
Original languageEnglish
JournalNano
Volume3
Issue number3
Pages (from-to)155-160
Number of pages6
ISSN1793-2920
DOIs
Publication statusPublished - Jun 2008
Externally publishedYes

Fingerprint

Electronic properties
Thin films
thin films
electronics
electrical measurement
electrical resistivity
Voltage measurement
Electric current measurement
Temperature
Atomic force microscopy
Activation energy
atomic force microscopy
activation energy
atmospheres
temperature dependence
probes
room temperature
electrons
temperature

Keywords

  • Endohedral metallofullerenes
  • electronic transport
  • atomic force microscopy

Cite this

Popok, V., Gromov, A. V., Jonsson, M., Taninaka, A., Shinohara, H., & Campbell, E. E. B. (2008). Electronic properties of thin films sublimed from La@C82 and Li@C60. Nano, 3(3), 155-160. https://doi.org/10.1142/S1793292008000988
Popok, Vladimir ; Gromov, A.V. ; Jonsson, Martin ; Taninaka, A. ; Shinohara, H. ; Campbell, Eleanor E.B. / Electronic properties of thin films sublimed from La@C82 and Li@C60. In: Nano. 2008 ; Vol. 3, No. 3. pp. 155-160.
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Popok, V, Gromov, AV, Jonsson, M, Taninaka, A, Shinohara, H & Campbell, EEB 2008, 'Electronic properties of thin films sublimed from La@C82 and Li@C60', Nano, vol. 3, no. 3, pp. 155-160. https://doi.org/10.1142/S1793292008000988

Electronic properties of thin films sublimed from La@C82 and Li@C60. / Popok, Vladimir; Gromov, A.V.; Jonsson, Martin; Taninaka, A.; Shinohara, H.; Campbell, Eleanor E.B.

In: Nano, Vol. 3, No. 3, 06.2008, p. 155-160.

Research output: Contribution to journalJournal articleResearchpeer-review

TY - JOUR

T1 - Electronic properties of thin films sublimed from La@C82 and Li@C60

AU - Popok, Vladimir

AU - Gromov, A.V.

AU - Jonsson, Martin

AU - Taninaka, A.

AU - Shinohara, H.

AU - Campbell, Eleanor E.B.

PY - 2008/6

Y1 - 2008/6

N2 - La@C82 and Li@C60 thin films are studied using four-probe current-voltage measurements and atomic force microscopy. In situ electrical measurements show semiconducting behaviour of both films with room-temperature resistivity of 21+-8 and 1230+-50 Ohm.cm for the La@C82 and Li@C60, respectively. A variable range hopping mechanism of conductance is suggested from the temperature dependences of resistance. The activation energies for electron transport are calculated for both metallofullerenes. Irreversible changes to the Li@C60 film structure increasing the film resistivity to values typical for C60 are found at elevated temperatures. The effect of exposure to ambient atmosphere on the conductance of the films is discussed.

AB - La@C82 and Li@C60 thin films are studied using four-probe current-voltage measurements and atomic force microscopy. In situ electrical measurements show semiconducting behaviour of both films with room-temperature resistivity of 21+-8 and 1230+-50 Ohm.cm for the La@C82 and Li@C60, respectively. A variable range hopping mechanism of conductance is suggested from the temperature dependences of resistance. The activation energies for electron transport are calculated for both metallofullerenes. Irreversible changes to the Li@C60 film structure increasing the film resistivity to values typical for C60 are found at elevated temperatures. The effect of exposure to ambient atmosphere on the conductance of the films is discussed.

KW - Endohedral metallofullerenes

KW - electronic transport

KW - atomic force microscopy

U2 - 10.1142/S1793292008000988

DO - 10.1142/S1793292008000988

M3 - Journal article

VL - 3

SP - 155

EP - 160

JO - Nano

JF - Nano

SN - 1793-2920

IS - 3

ER -

Popok V, Gromov AV, Jonsson M, Taninaka A, Shinohara H, Campbell EEB. Electronic properties of thin films sublimed from La@C82 and Li@C60. Nano. 2008 Jun;3(3):155-160. https://doi.org/10.1142/S1793292008000988