Enhancement of Electroluminescence images for fault detection in photovoltaic panels

Harsh Parikh, Sergiu Spataru, Dezso Sera, Claire Mantel, Soren Forchhammer, Gisele A. dos Reis Benatto, Nicholas Reidel, Peter B Poulsen

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

6 Citations (Scopus)
204 Downloads (Pure)

Abstract

Good quality images are necessary for electroluminescence (EL) image analysis and failure
quantification in solar panels. In this work, a method for determining image quality in terms of more accurate failure detection in PV panels through EL imaging is proposed. The goal of the paper is to highlight the different methods for image quality improvement and to determine if the enhanced image provides more useful diagnostic information for accurate micro cracks and fracture detection. From the work carried out in this paper, it is to be noted that averaging technique helps in improving the SNR value. Additionally, subtracting the background from the obtained averaged EL image proves to be an enhancing method for cell fracture identification and more number of edges are also detected which can be useful for micro crack quantification.
Original languageEnglish
Title of host publicationProceedings of 7th World Conference on Photovoltaic Energy Conversion
Number of pages6
PublisherIEEE Press
Publication dateJun 2018
Pages1-6
DOIs
Publication statusPublished - Jun 2018
Event7th World Conference on Photovoltaic Energy Conversion - Hilton Waikoloa Village, Waikoloa, United States
Duration: 10 Jun 201815 Jun 2018
http://www.wcpec7.org/WCPEC-7/

Conference

Conference7th World Conference on Photovoltaic Energy Conversion
LocationHilton Waikoloa Village
Country/TerritoryUnited States
CityWaikoloa
Period10/06/201815/06/2018
Internet address
SeriesI E E E Photovoltaic Specialists Conference. Conference Record
ISSN0160-8371

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