Enhancing Performance of Machine Learning-Based Modeling of Electromagnetic Structures

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Abstract

The machine learning (ML)-based modeling of electromagnetic (EM) structures involves the development of a surrogate model that approximates the relationship between EM geometries and responses, such as S 11 , gain, etc. The performance of the surrogate model is mainly affected by the simulation data for training. Normally, the training data is collected by uniformly sweeping the geometric parameters. Restricted by the computation power, only a limited parameter space can be sampled. The trained surrogate model behaves well within the sampling range but deteriorates as the parameter range extends. In this paper, we expand the predictable parameter range of an ML model with the same simulation expense by optimizing the data acquisition strategy. This approach leads to the proposed model demonstrating higher accuracy within an extended parameter space than conventional models, while the simulation consumption remains the same. We present an application example to validate its effectiveness. The proposed modified ML-based design method can potentially improve the performance of surrogate models in real-world applications.
Original languageEnglish
Title of host publication2023 IEEE Conference on Antenna Measurements and Applications, CAMA
Number of pages3
PublisherIEEE (Institute of Electrical and Electronics Engineers)
Publication date19 Dec 2023
Pages58-60
Article number10352704
ISBN (Print)979-8-3503-2305-4
ISBN (Electronic)979-8-3503-2304-7
DOIs
Publication statusPublished - 19 Dec 2023
Event2023 IEEE Conference on Antenna Measurements and Applications (CAMA) - Genoa, Italy
Duration: 15 Nov 202317 Nov 2023

Conference

Conference2023 IEEE Conference on Antenna Measurements and Applications (CAMA)
Country/TerritoryItaly
CityGenoa
Period15/11/202317/11/2023
SeriesIEEE Conference on Antenna Measurements & Applications (CAMA)
ISSN2643-6795

Keywords

  • electromagnetic
  • machine learning
  • modeling
  • surrogate model

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