Er sensitization by a thin Si layer: Interaction-distance dependence

Brian Julsgaard; Ying-Wei Lu; Rasmus Vincentz Skougaard Jensen; Thomas Garm Pedersen; Kjeld Pedersen; Jacques Chevallier; Peter Balling; Arne Nylandsted Larsen

doi:10.1103/PhysRevB.84.085403

Er sensitization by a thin Si layer: Interaction-distance dependence

Brian Julsgaard, Ying-Wei Lu, Rasmus Vincentz Skougaard Jensen, Thomas Garm Pedersen, Kjeld Pedersen, Jacques Chevallier, Peter Balling, Arne Nylandsted Larsen

Research output: Contribution to journal › Journal article › Research › peer-review

6 Citations (Scopus)

Original language	English
Journal	Physical Review B (Condensed Matter and Materials Physics)
Volume	84
Issue number	8
ISSN	1098-0121
DOIs	https://doi.org/10.1103/PhysRevB.84.085403
Publication status	Published - 2011

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Cite this

@article{95a027ce37114ff398104ddd106a9f34,

title = "Er sensitization by a thin Si layer: Interaction-distance dependence",

author = "Brian Julsgaard and Ying-Wei Lu and Jensen, {Rasmus Vincentz Skougaard} and Pedersen, {Thomas Garm} and Kjeld Pedersen and Jacques Chevallier and Peter Balling and Larsen, {Arne Nylandsted}",

year = "2011",

doi = "10.1103/PhysRevB.84.085403",

language = "English",

volume = "84",

journal = "Physical Review B (Condensed Matter and Materials Physics)",

issn = "1098-0121",

publisher = "American Physical Society",

number = "8",

}

TY - JOUR

T1 - Er sensitization by a thin Si layer: Interaction-distance dependence

AU - Julsgaard, Brian

AU - Lu, Ying-Wei

AU - Jensen, Rasmus Vincentz Skougaard

AU - Pedersen, Thomas Garm

AU - Pedersen, Kjeld

AU - Chevallier, Jacques

AU - Balling, Peter

AU - Larsen, Arne Nylandsted

PY - 2011

Y1 - 2011

U2 - 10.1103/PhysRevB.84.085403

DO - 10.1103/PhysRevB.84.085403

M3 - Journal article

SN - 1098-0121

VL - 84

JO - Physical Review B (Condensed Matter and Materials Physics)

JF - Physical Review B (Condensed Matter and Materials Physics)

IS - 8

ER -