Experimental Evaluation of IGBT Junction Temperature Measurement via a Modified-VCE (ΔVCE_ΔVGE) Method with Series Resistance Removal

Nick Baker, Francesco Iannuzzo, Stig Munk-Nielsen, Laurent Dupont, Yvan Avenas

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

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Engineering

Chemical Engineering