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Abstract
This article discusses an approach for extracting the temperature dependency of the electrical interfacial resistance associated with thermoelectric devices. The method combines a traditional module-level test rig and a nonlinear numerical model of thermoelectricity to minimize measurement errors on the interfacial resistance. The extracted results represent useful data to investigating the characteristics of thermoelectric module resistance and comparing performance of various modules.
Original language | English |
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Journal | Review of Scientific Instruments |
Volume | 82 |
Issue number | 11 |
Number of pages | 3 |
ISSN | 0034-6748 |
DOIs | |
Publication status | Published - 30 Nov 2011 |
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Dive into the research topics of 'Extraction of temperature dependent interfacial resistance of thermoelectric modules'. Together they form a unique fingerprint.Projects
- 1 Finished
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Co-simulation and Co-optimization of Thermoelectric Generation System
Chen, M.
15/03/2010 → 15/09/2012
Project: Research