Fault Detection of Supermarket Refrigeration Systems Using Convolutional Neural Network

Zahra Soltani, Kresten Kjaer Soerensen, John Leth, Jan Dimon Bendtsen

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

Original languageEnglish
Title of host publicationIECON 2020 The 46th Annual Conference of the IEEE Industrial Electronics Society
Number of pages8
PublisherIEEE Computer Society Press
Publication date18 Oct 2020
Pages231-238
Article number9254485
ISBN (Print)978-1-7281-5415-2
ISBN (Electronic)978-1-7281-5414-5
DOIs
Publication statusPublished - 18 Oct 2020
Event46th Annual Conference of the IEEE Industrial Electronics Society, IECON 2020 - Virtual, Singapore, Singapore
Duration: 18 Oct 202021 Oct 2020
http://www.conferences.academicjournals.org/cat/physical-sciences/46th-annual-conference-of-the-ieee-industrial-electronics-society

Conference

Conference46th Annual Conference of the IEEE Industrial Electronics Society, IECON 2020
CountrySingapore
CityVirtual, Singapore
Period18/10/202021/10/2020
SponsorIEEE Industrial Electronics Society (IES), SPECS - Smart Grid + Power Electronics Consortium Singapore, The Institute of Electrical and Electronics Engineers (IEEE)
Internet address
SeriesProceedings of the Annual Conference of the IEEE Industrial Electronics Society
ISSN1553-572X

Keywords

  • classification
  • convolutioal
  • data quality
  • evaporation
  • fault
  • machine learning
  • neural network
  • refrigeration

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