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Abstract
This article proposes a fault identification method, based on the complementary analysis of the light and dark current-voltage (I-V) characteristics of the photovoltaic (PV) module, to distinguish between four important degradation modes that lead to power loss in PV modules: (a) degradation of the electrical circuit of the PV module (cell interconnect breaks; corrosion of the junction box, module cables and connectors); (b) mechanical damage to the solar cells (cell microcracks and fractures); (c) potential-induced degradation (PID) sustained by the module; and (d) optical losses affecting the module (soiling, shading, discoloration). The premise of the method that is proposed is that different degradation modes affect the light and dark I-V characteristics of the PV module in different ways, leaving distinct signatures. This work focuses on identifying and correlating these specific signatures present in the light and dark I-V measurements, to specific degradation modes; a number of new dark I-V diagnostic parameters are proposed to quantify these signatures. The experimental results show that these dark I-V diagnostic parameters, complemented by light I-V performance and series resistance measurements can accurately detect and identify the four degradation modes discussed.
Original language | English |
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Journal | Progress in Photovoltaics |
Volume | 24 |
Issue number | 4 |
Pages (from-to) | 517-532 |
ISSN | 1062-7995 |
DOIs | |
Publication status | Published - Apr 2016 |
Event | 29th EU PVSEC - Amsterdam, Netherlands Duration: 22 Sept 2014 → 26 Sept 2014 http://www.eea.europa.eu/events/29th-european-photovoltaic-solar-energy |
Conference
Conference | 29th EU PVSEC |
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Country/Territory | Netherlands |
City | Amsterdam |
Period | 22/09/2014 → 26/09/2014 |
Internet address |
Keywords
- Fault identification
- Characterization
- Degradation
- dark I–V characteristic
- series resistance;
- cell cracks
- optical losses
- potential-induced degradation
Fingerprint
Dive into the research topics of 'Fault identification in crystalline silicon PV modules by complementary analysis of the light and dark current-voltage characteristics'. Together they form a unique fingerprint.Projects
- 1 Finished
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SPVSYS: Smart Photovoltaic Systems
Teodorescu, R., Séra, D., Kerekes, T., Borup, U., Spataru, S. V. & Bogdan, C.
01/01/2011 → 31/07/2015
Project: Research