Fault identification in crystalline silicon PV modules by complementary analysis of the light and dark current-voltage characteristics

Sergiu Spataru, Dezso Sera, Peter Hacke, Tamas Kerekes, Remus Teodorescu

Research output: Contribution to journalConference article in JournalResearchpeer-review

18 Citations (Scopus)

Abstract

This article proposes a fault identification method, based on the complementary analysis of the light and dark current-voltage (I-V) characteristics of the photovoltaic (PV) module, to distinguish between four important degradation modes that lead to power loss in PV modules: (a) degradation of the electrical circuit of the PV module (cell interconnect breaks; corrosion of the junction box, module cables and connectors); (b) mechanical damage to the solar cells (cell microcracks and fractures); (c) potential-induced degradation (PID) sustained by the module; and (d) optical losses affecting the module (soiling, shading, discoloration). The premise of the method that is proposed is that different degradation modes affect the light and dark I-V characteristics of the PV module in different ways, leaving distinct signatures. This work focuses on identifying and correlating these specific signatures present in the light and dark I-V measurements, to specific degradation modes; a number of new dark I-V diagnostic parameters are proposed to quantify these signatures. The experimental results show that these dark I-V diagnostic parameters, complemented by light I-V performance and series resistance measurements can accurately detect and identify the four degradation modes discussed.
Original languageEnglish
JournalProgress in Photovoltaics
Volume24
Issue number4
Pages (from-to)517-532
ISSN1062-7995
DOIs
Publication statusPublished - Apr 2016
Event29th EU PVSEC - Amsterdam, Netherlands
Duration: 22 Sep 201426 Sep 2014
http://www.eea.europa.eu/events/29th-european-photovoltaic-solar-energy

Conference

Conference29th EU PVSEC
CountryNetherlands
CityAmsterdam
Period22/09/201426/09/2014
Internet address

Keywords

  • Fault identification
  • Characterization
  • Degradation
  • dark I–V characteristic
  • series resistance;
  • cell cracks
  • optical losses
  • potential-induced degradation

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  • Projects

    SPVSYS: Smart Photovoltaic Systems

    Teodorescu, R., Séra, D., Kerekes, T., Borup, U., Spataru, S. V. & Bogdan, C.

    ForskEL

    01/01/201131/07/2015

    Project: Research

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