Perturbation of near-field scan from connected cables

Morten Sørensen, Ondrej Franek, Gert Frølund Pedersen, Knud A. Baltsen, Hans Ebert

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

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Abstract

The perturbation of near-fields scan from connected cables are investigated and how to handle the cables is discussed. A connected cable induced small but theoretical detectable changes in the near-field. This change can be seen in Huygens’ box simulations (equivalent source currents on a box) at the cable resonance frequencies while there is no change away from the resonance frequencies.
Translated title of the contributionForstyrrelse af nær-felt scanning fra tilsluttede kabler
Original languageEnglish
Title of host publication2012 IEEE International Symposium on Electromagnetic Compatibility
Number of pages6
PublisherIEEE
Publication dateAug 2012
Pages594-599
ISBN (Print)978-1-4673-2061-0
ISBN (Electronic)978-1-4673-2059-7
DOIs
Publication statusPublished - Aug 2012
EventIEEE International Symposium on Electromagnetic compatibility - David L Lawrence Convention Center, Pittsburgh, United States
Duration: 6 Aug 201210 Aug 2012

Conference

ConferenceIEEE International Symposium on Electromagnetic compatibility
LocationDavid L Lawrence Convention Center
Country/TerritoryUnited States
CityPittsburgh
Period06/08/201210/08/2012
SeriesIEEE International Symposium on Electromagnetic Compatibility (EMC)
ISSN2158-110X

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