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Abstract
This paper describes a comprehensive modeling approach on reliability of fuses used in power electronic circuits. When fuses are subjected to current pulses, cyclic temperature stress is introduced to the fuse element and will wear out the component. Furthermore, the fuse may be used in a large variation of ambient temperature, e.g. in deserts and the accumulated damage in the fuse elements is gradually increasing due to thermo-mechanical stress that results in resistance increase and further unexpected failures. Consequently, the electrical characteristics of the fuse like I2t, breaking capacity, and rated voltage/current are opposed to shift in time to effect early breaking during the normal operation of the circuit. Therefore, in such cases, a reliable protection required for the other circuit components will not be achieved. The thermo-mechanical models, fatigue analysis and thermo-electrical models of fuses are presented by FEM simulations in order to identify the important factors affecting the performance of fuses at different ambient temperatures and cycling operation.
| Original language | English |
|---|---|
| Title of host publication | Proceedings of the 2017 IEEE Applied Power Electronics Conference and Exposition (APEC) |
| Number of pages | 8 |
| Publisher | IEEE Press |
| Publication date | Mar 2017 |
| Pages | 829-836 |
| ISBN (Print) | 978-1-5090-5366-7 |
| DOIs | |
| Publication status | Published - Mar 2017 |
| Event | 2017 IEEE Applied Power Electronics Conference and Exposition (APEC) - Tampa Convention Center, Tampa, FL, United States Duration: 26 Mar 2017 → 30 Mar 2017 |
Conference
| Conference | 2017 IEEE Applied Power Electronics Conference and Exposition (APEC) |
|---|---|
| Location | Tampa Convention Center |
| Country/Territory | United States |
| City | Tampa, FL |
| Period | 26/03/2017 → 30/03/2017 |
| Series | IEEE Applied Power Electronics Conference and Exposition (APEC) |
|---|---|
| ISSN | 2470-6647 |
Keywords
- Fatique
- Finite element method
- Fuse
- Thermal stress
- Reliability
Fingerprint
Dive into the research topics of 'Fuse Modeling for Reliability Study of Power Electronic Circuits'. Together they form a unique fingerprint.Projects
- 1 Finished
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Center Of Reliable Power Electronics (CORPE)
Blaabjerg, F. (PI), Munk-Nielsen, S. (Project Participant), Pedersen, K. (Project Participant) & Popok, V. (Project Participant)
01/04/2011 → 31/12/2016
Project: Research