Fuse Modeling for Reliability Study of Power Electronic Circuits

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Abstract

This paper describes a comprehensive modeling approach on reliability of fuses used in power electronic circuits. When fuses are subjected to current pulses, cyclic temperature stress is introduced to the fuse element and will wear out the component. Furthermore, the fuse may be used in a large variation of ambient temperature, e.g. in deserts and the accumulated damage in the fuse elements is gradually increasing due to thermo-mechanical stress that results in resistance increase and further unexpected failures. Consequently, the electrical characteristics of the fuse like I2t, breaking capacity, and rated voltage/current are opposed to shift in time to effect early breaking during the normal operation of the circuit. Therefore, in such cases, a reliable protection required for the other circuit components will not be achieved. The thermo-mechanical models, fatigue analysis and thermo-electrical models of fuses are presented by FEM simulations in order to identify the important factors affecting the performance of fuses at different ambient temperatures and cycling operation.
Original languageEnglish
Title of host publicationProceedings of the 2017 IEEE Applied Power Electronics Conference and Exposition (APEC)
Number of pages8
PublisherIEEE Press
Publication dateMar 2017
Pages829-836
ISBN (Print)978-1-5090-5366-7
DOIs
Publication statusPublished - Mar 2017
Event2017 IEEE Applied Power Electronics Conference and Exposition (APEC) - Tampa Convention Center, Tampa, FL, United States
Duration: 26 Mar 201730 Mar 2017

Conference

Conference2017 IEEE Applied Power Electronics Conference and Exposition (APEC)
LocationTampa Convention Center
Country/TerritoryUnited States
CityTampa, FL
Period26/03/201730/03/2017
SeriesIEEE Applied Power Electronics Conference and Exposition (APEC)
ISSN2470-6647

Keywords

  • Fatique
  • Finite element method
  • Fuse
  • Thermal stress
  • Reliability

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