General Accuracy Considerations of Microwave On-Wafer Silicon Device Measurements

Troels Emil Kolding

Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research

Original language	English
Title of host publication	IEEE MTT-S International Microwave Symposium Digest (IMS), Boston, Massachusetts, USA, June 2000
Publication date	1996
Pages	1839-1842
Publication status	Published - 1996
Event	General Accuracy Considerations of Microwave On-Wafer Silicon Device Measurements - Duration: 19 May 2010 → …

Conference	General Accuracy Considerations of Microwave On-Wafer Silicon Device Measurements
Period	19/05/2010 → …

AUB Link

@inproceedings{4ea97ae08ac211dbbb3d000ea68e967b,

title = "General Accuracy Considerations of Microwave On-Wafer Silicon Device Measurements",

author = "Kolding, {Troels Emil}",

year = "1996",

language = "English",

pages = "1839--1842",

booktitle = "IEEE MTT-S International Microwave Symposium Digest (IMS), Boston, Massachusetts, USA, June 2000",

note = "General Accuracy Considerations of Microwave On-Wafer Silicon Device Measurements ; Conference date: 19-05-2010",

}

TY - GEN

T1 - General Accuracy Considerations of Microwave On-Wafer Silicon Device Measurements

AU - Kolding, Troels Emil

PY - 1996

Y1 - 1996

M3 - Article in proceeding

SP - 1839

EP - 1842

BT - IEEE MTT-S International Microwave Symposium Digest (IMS), Boston, Massachusetts, USA, June 2000

T2 - General Accuracy Considerations of Microwave On-Wafer Silicon Device Measurements

Y2 - 19 May 2010

ER -