Growth direction of oblique angle electron beam deposited silicon monoxide thin films identified by optical second-harmonic generation

Søren Vejling Andersen, Mads Lund Trolle, Kjeld Pedersen

    Research output: Contribution to journalJournal articleResearchpeer-review

    2 Citations (Scopus)
    Original languageEnglish
    Article number231906
    JournalApplied Physics Letters
    Volume103
    Issue number23
    Number of pages4
    ISSN0003-6951
    DOIs
    Publication statusPublished - 3 Dec 2013

    Cite this

    @article{68570fd4b5eb4ceea58c9c1b38edbc83,
    title = "Growth direction of oblique angle electron beam deposited silicon monoxide thin films identified by optical second-harmonic generation",
    author = "Andersen, {S{\o}ren Vejling} and Trolle, {Mads Lund} and Kjeld Pedersen",
    year = "2013",
    month = "12",
    day = "3",
    doi = "10.1063/1.4835075",
    language = "English",
    volume = "103",
    journal = "Applied Physics Letters",
    issn = "0003-6951",
    publisher = "American Institute of Physics",
    number = "23",

    }

    Growth direction of oblique angle electron beam deposited silicon monoxide thin films identified by optical second-harmonic generation. / Andersen, Søren Vejling; Trolle, Mads Lund; Pedersen, Kjeld.

    In: Applied Physics Letters, Vol. 103, No. 23, 231906, 03.12.2013.

    Research output: Contribution to journalJournal articleResearchpeer-review

    TY - JOUR

    T1 - Growth direction of oblique angle electron beam deposited silicon monoxide thin films identified by optical second-harmonic generation

    AU - Andersen, Søren Vejling

    AU - Trolle, Mads Lund

    AU - Pedersen, Kjeld

    PY - 2013/12/3

    Y1 - 2013/12/3

    U2 - 10.1063/1.4835075

    DO - 10.1063/1.4835075

    M3 - Journal article

    VL - 103

    JO - Applied Physics Letters

    JF - Applied Physics Letters

    SN - 0003-6951

    IS - 23

    M1 - 231906

    ER -