Guest Editorial: Metrology for 5G Technologies

Wei Fan; xiaoming chen; Pekka Kyösti; Moray  Rumney; Tian  Hong Loh

doi:10.1049/iet-map.2019.0982

Guest Editorial: Metrology for 5G Technologies

Wei Fan^*, xiaoming chen, Pekka Kyösti, Moray Rumney, Tian Hong Loh

^*Corresponding author for this work

Research output: Contribution to journal › Editorial › peer-review

Original language	English
Journal	IET Microwaves, Antennas & Propagation
Volume	13
Issue number	15
Pages (from-to)	2581-2583
Number of pages	3
ISSN	1751-8725
DOIs	https://doi.org/10.1049/iet-map.2019.0982
Publication status	Published - Dec 2019

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@article{8a6f49c0e2cf433d873df3829a14a5fc,

title = "Guest Editorial: Metrology for 5G Technologies",

author = "Wei Fan and xiaoming chen and Pekka Ky{\"o}sti and Moray Rumney and {Hong Loh}, Tian",

year = "2019",

month = dec,

doi = "10.1049/iet-map.2019.0982",

language = "English",

volume = "13",

pages = "2581--2583",

journal = "IET Microwaves, Antennas & Propagation",

issn = "1751-8725",

publisher = "Institution of Engineering and Technology",

number = "15",

}

TY - JOUR

T1 - Guest Editorial

T2 - Metrology for 5G Technologies

AU - Fan, Wei

AU - chen, xiaoming

AU - Kyösti, Pekka

AU - Rumney, Moray

AU - Hong Loh , Tian

PY - 2019/12

Y1 - 2019/12

UR - http://www.scopus.com/inward/record.url?scp=85075856114&partnerID=8YFLogxK

U2 - 10.1049/iet-map.2019.0982

DO - 10.1049/iet-map.2019.0982

M3 - Editorial

SN - 1751-8725

VL - 13

SP - 2581

EP - 2583

JO - IET Microwaves, Antennas & Propagation

JF - IET Microwaves, Antennas & Propagation

IS - 15

ER -

Guest Editorial: Metrology for 5G Technologies

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