TY - JOUR
T1 - Guest Editorial Special Section on Advancing Power Electronics Reliability
T2 - Components, Systems, and Intelligent Operation
AU - Wang, Huai
AU - Hu, Jingxin
AU - De Doncker, Rik W.
PY - 2024
Y1 - 2024
N2 - Power electronics play a pivotal role in various applications, ranging from renewable energy systems to electric vehicles, data centers, aerospace, industrial automation, HVdc, and more. Consequently, ensuring the reliability of power electronic components and systems becomes undoubtedly important. IEEE Transactions on Power Electronics (TPEL) has published a Special Issue on Robust Design and Reliability of Power Electronics in 2015 (refer to vol. 30, no. 5). Over the last decade, new applications, concepts, and methods have emerged, reflecting a growing interest in this research area from both academia and industry. At the component level, SiC and GaN devices and new packaging materials are gaining prominence. Understanding the failure mechanisms, characterization techniques, and performance optimization of these new components is of utmost importance. At the system level, robust design methodologies, effective testing strategies, condition monitoring techniques, and artificial intelligence have shown tremendous potential in enhancing reliability.
AB - Power electronics play a pivotal role in various applications, ranging from renewable energy systems to electric vehicles, data centers, aerospace, industrial automation, HVdc, and more. Consequently, ensuring the reliability of power electronic components and systems becomes undoubtedly important. IEEE Transactions on Power Electronics (TPEL) has published a Special Issue on Robust Design and Reliability of Power Electronics in 2015 (refer to vol. 30, no. 5). Over the last decade, new applications, concepts, and methods have emerged, reflecting a growing interest in this research area from both academia and industry. At the component level, SiC and GaN devices and new packaging materials are gaining prominence. Understanding the failure mechanisms, characterization techniques, and performance optimization of these new components is of utmost importance. At the system level, robust design methodologies, effective testing strategies, condition monitoring techniques, and artificial intelligence have shown tremendous potential in enhancing reliability.
UR - http://www.scopus.com/inward/record.url?scp=85204238595&partnerID=8YFLogxK
U2 - 10.1109/TPEL.2024.3451868
DO - 10.1109/TPEL.2024.3451868
M3 - Editorial
AN - SCOPUS:85204238595
SN - 0885-8993
VL - 39
SP - 14216
EP - 14217
JO - IEEE Transactions on Power Electronics
JF - IEEE Transactions on Power Electronics
IS - 11
ER -