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Abstract
The structural optimization of power modules for reliability can be performed without physical prototyping if the structural weakness in modules can be assessed on a 3D model. In this study, 3D thermal stress simulation is investigated as a predictive tool for the heat cycle test (R CT) failure point of the medium voltage power module. The module has a multi- layer structure of two different ceramics (A12O3 and AIN) to reduce the parasitic capacitance. In this complex structured module, the failure point of actual test samples are shown to coincide with weakness points of the thermo-mechanical stress in the 3D simulation. The heat cycle test (125/-40°C) was used for simulation and testing. The failure point of the module was predominantly copper delamination from the AIN substrate surface after HCT 100 cycles. The delaminated locations were matched to points in the simulation that has 2 characteristics, high peeling stresses points and high shape deformation of copper pattern at the simulation results. This observation applies to copper patterns only connected to the ceramics, while copper patterns connected to other adjacent layers did not follow this trend.
Original language | English |
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Title of host publication | 2023 IEEE Applied Power Electronics Conference and Exposition (APEC) |
Number of pages | 8 |
Publisher | IEEE |
Publication date | 19 Mar 2023 |
Pages | 2668-2675 |
Article number | 10131157 |
ISBN (Print) | 978-1-6654-7540-2 |
ISBN (Electronic) | 978-1-6654-7539-6 |
DOIs | |
Publication status | Published - 19 Mar 2023 |
Event | 38th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2023 - Orlando, United States Duration: 19 Mar 2023 → 23 Mar 2023 |
Conference
Conference | 38th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2023 |
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Country/Territory | United States |
City | Orlando |
Period | 19/03/2023 → 23/03/2023 |
Sponsor | IEEE Industry Applications Society (IAS), IEEE Power Electronics Society (PELS), Power Sources Manufacturers Association (PSMA) |
Series | IEEE Applied Power Electronics Conference and Exposition (APEC) |
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ISSN | 1048-2334 |
Keywords
- DCB
- Medium Voltage
- Power Module
- Reliability Analysis
- Simulation and Modelling
- Thermo-mechanical behaviour
- 3D modeling
- l0kV SiC-MOSFET power modules
- Finite Element Method
- heat cycle
- thermo-mechanical stress
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CoDE: Center of Digitalized Electronics (CoDE)
Munk-Nielsen, S., Jørgensen, A. B., Uhrenfeldt, C., Beczkowski, S., Ahmad, F., Meinert, J. D., Kubulus, P. P., Takahashi, M., Sun, Z., Wang, R., Gao, Y., Zäch, M. R., Meyer, S., Liccardi, S., Kristensen, N. H. & Steffensen, B.
01/01/2021 → 31/12/2026
Project: Research
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Developing the Novel Reliability Design Method with 3D-simulation of SiC Power Module
Takahashi, M., Uhrenfeldt, C., Munk-Nielsen, S. & Jørgensen, A. B.
01/10/2021 → 30/09/2024
Project: PhD Project
Prizes
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APEC 2023 Outstanding poster award
Takahashi, Masaki (Recipient), Jørgensen, Jannick Kjær (Recipient), Jørgensen, Asger Bjørn (Recipient), Munk-Nielsen, Stig (Recipient) & Uhrenfeldt, Christian (Recipient), 23 Mar 2023
Prize: Conference prizes