Heat cycle failure point prediction by 3D thermal stress analysis for medium voltage power module

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Abstract

The structural optimization of power modules for reliability can be performed without physical prototyping if the structural weakness in modules can be assessed on a 3D model. In this study, 3D thermal stress simulation is investigated as a predictive tool for the heat cycle test (R CT) failure point of the medium voltage power module. The module has a multi- layer structure of two different ceramics (A12O3 and AIN) to reduce the parasitic capacitance. In this complex structured module, the failure point of actual test samples are shown to coincide with weakness points of the thermo-mechanical stress in the 3D simulation. The heat cycle test (125/-40°C) was used for simulation and testing. The failure point of the module was predominantly copper delamination from the AIN substrate surface after HCT 100 cycles. The delaminated locations were matched to points in the simulation that has 2 characteristics, high peeling stresses points and high shape deformation of copper pattern at the simulation results. This observation applies to copper patterns only connected to the ceramics, while copper patterns connected to other adjacent layers did not follow this trend.

Original languageEnglish
Title of host publication2023 IEEE Applied Power Electronics Conference and Exposition (APEC)
Number of pages8
PublisherIEEE
Publication date19 Mar 2023
Pages2668-2675
Article number10131157
ISBN (Print)978-1-6654-7540-2
ISBN (Electronic)978-1-6654-7539-6
DOIs
Publication statusPublished - 19 Mar 2023
Event38th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2023 - Orlando, United States
Duration: 19 Mar 202323 Mar 2023

Conference

Conference38th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2023
Country/TerritoryUnited States
CityOrlando
Period19/03/202323/03/2023
SponsorIEEE Industry Applications Society (IAS), IEEE Power Electronics Society (PELS), Power Sources Manufacturers Association (PSMA)
SeriesIEEE Applied Power Electronics Conference and Exposition (APEC)
ISSN1048-2334

Keywords

  • DCB
  • Medium Voltage
  • Power Module
  • Reliability Analysis
  • Simulation and Modelling
  • Thermo-mechanical behaviour
  • 3D modeling
  • l0kV SiC-MOSFET power modules
  • Finite Element Method
  • heat cycle
  • thermo-mechanical stress

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