High Frequency MOS Transistor Matching Measurements for the Determination of Mixer Port Crosstalk

S. Laursen

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearch

3 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings of IEEE International Conference on Microelectronic Test Structures (ICMTS), Kobe, Japan, March 2001
Publication date2001
Pages11-14
Publication statusPublished - 2001
EventHigh Frequency MOS Transistor Matching Measurements for the Determination of Mixer Port Crosstalk -
Duration: 19 May 2010 → …

Conference

ConferenceHigh Frequency MOS Transistor Matching Measurements for the Determination of Mixer Port Crosstalk
Period19/05/2010 → …

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