Hotspots and performance evaluation of crystalline-silicon and thin-film photovoltaic modules

Syed Ahsan, Kamran Ali Khan Niazi, Hassan A. Khan, Yongheng Yang

Research output: Contribution to journalConference article in JournalResearchpeer-review

26 Citations (Scopus)

Abstract

The reliability of solar photovoltaic (PV) panels is significantly affected by the formation of hotspots in active operation. In this paper, hotspots are analysed in conventional crystalline-silicon (c-Si) and emerging thin-film (TF) Copper Indium Selenide (CIS) PV modules, along with the investigation of the shading effects on their performance. Both module technologies behave differently in varying shade scenarios with the CIS TF panel technology showing superior results in terms of hotspots and the power output. The better performance in CIS TF is attributed to its monolithic panel architecture, which allows better redistribution of the voltages and currents within the module. It was observed that, for a typical module, the overall shadow-induced reverse temperature is lower in CIS TF modules. This paper therefore provides useful insights for PV system planning and operation for regions with high average temperatures along with potential issues due to partial shadings.
Original languageEnglish
JournalMicroelectronics Reliability
Volume88-90
Pages (from-to)1014-1018
Number of pages5
ISSN0026-2714
DOIs
Publication statusPublished - Sep 2018
Event29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - AKKC, Aalborg, Denmark
Duration: 1 Oct 20185 Oct 2018
Conference number: 29th
http://www.esref2018conf.org/

Conference

Conference29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
Number29th
LocationAKKC
Country/TerritoryDenmark
CityAalborg
Period01/10/201805/10/2018
Internet address

Keywords

  • Partial shade
  • Hotspots
  • Thin-film panels
  • Crystalline-silicon modules
  • Thermographic analysis

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