Abstract
The accelerated aging test is a powerful tool to stress batteries and predict their performance. Although some test conditions cause the battery to age more rapidly, it may force other unexpected effects on how they age over time, leading to a misunderstanding of normal lifetime results. This paper explores the experimental stress intervals for commercial LFP/C batteries to ensure mechanistic consistency based on a 43-month calendar aging test and a 10-month cyclic aging test, taking the log-normal distribution as a time-to-failure statistical lifetime model. A comprehensive study is performed based on capacity measurements during calendar aging considering two stress factors (the temperature and the state-of-charge (SOC) level) and cycling aging considering three stress factors (the temperature, the SOC level, and the cycle-depth (CD) level). The permutation test using likelihood ratio (LR) is used to determine the consistency of parameter estimates. Based on the consistent acceleration factor principle, test conditions causing different lifetime behaviors can be pointed out. The ranking of different stress effects in the test range can be obtained. This method can be used as a reference to make reasonable test plans for detecting battery's performance, thereby, predicting their lifetime more accurately.
Original language | English |
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Title of host publication | APEC 2023 - 38th Annual IEEE Applied Power Electronics Conference and Exposition |
Number of pages | 6 |
Publisher | IEEE (Institute of Electrical and Electronics Engineers) |
Publication date | 2023 |
Pages | 1816-1821 |
Article number | 10131387 |
ISBN (Electronic) | 9781665475396 |
DOIs | |
Publication status | Published - 2023 |
Event | 38th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2023 - Orlando, United States Duration: 19 Mar 2023 → 23 Mar 2023 |
Conference
Conference | 38th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2023 |
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Country/Territory | United States |
City | Orlando |
Period | 19/03/2023 → 23/03/2023 |
Sponsor | IEEE Industry Applications Society (IAS), IEEE Power Electronics Society (PELS), Power Sources Manufacturers Association (PSMA) |
Series | Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC |
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Volume | 2023-March |
Bibliographical note
Publisher Copyright:© 2023 IEEE.
Keywords
- accelerated aging test
- LFP/C battery
- lognormal distribution
- LR permutation test
- mechanistic consistency