Abstract

The accelerated aging test is a powerful tool to stress batteries and predict their performance. Although some test conditions cause the battery to age more rapidly, it may force other unexpected effects on how they age over time, leading to a misunderstanding of normal lifetime results. This paper explores the experimental stress intervals for commercial LFP/C batteries to ensure mechanistic consistency based on a 43-month calendar aging test and a 10-month cyclic aging test, taking the log-normal distribution as a time-to-failure statistical lifetime model. A comprehensive study is performed based on capacity measurements during calendar aging considering two stress factors (the temperature and the state-of-charge (SOC) level) and cycling aging considering three stress factors (the temperature, the SOC level, and the cycle-depth (CD) level). The permutation test using likelihood ratio (LR) is used to determine the consistency of parameter estimates. Based on the consistent acceleration factor principle, test conditions causing different lifetime behaviors can be pointed out. The ranking of different stress effects in the test range can be obtained. This method can be used as a reference to make reasonable test plans for detecting battery's performance, thereby, predicting their lifetime more accurately.

Original languageEnglish
Title of host publicationAPEC 2023 - 38th Annual IEEE Applied Power Electronics Conference and Exposition
Number of pages6
PublisherIEEE (Institute of Electrical and Electronics Engineers)
Publication date2023
Pages1816-1821
Article number10131387
ISBN (Electronic)9781665475396
DOIs
Publication statusPublished - 2023
Event38th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2023 - Orlando, United States
Duration: 19 Mar 202323 Mar 2023

Conference

Conference38th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2023
Country/TerritoryUnited States
CityOrlando
Period19/03/202323/03/2023
SponsorIEEE Industry Applications Society (IAS), IEEE Power Electronics Society (PELS), Power Sources Manufacturers Association (PSMA)
SeriesConference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC
Volume2023-March

Bibliographical note

Publisher Copyright:
© 2023 IEEE.

Keywords

  • accelerated aging test
  • LFP/C battery
  • lognormal distribution
  • LR permutation test
  • mechanistic consistency

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