In vivo charge injection limits increased after 'unsafe' stimulation

Suzan Meijs, Søren Sørensen, Kristian Rechendorff, Nico Rijkhoff

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

Abstract

The effect of unsafe stimulation on charge injection limits (Qinj) and pulsing capacitance (Cpulse) was investigated. Four stimulation protocols were applied: 20 mA – 200 and 400 Hz, 50 mA – 200 and 400 Hz. Increasing Qinj and Cpulse were observed for all stimulation protocols. Corrosion was not observed with any of the stimulation protocols and no tissue damage was observed for the 20 mA – 200 Hz stimulation group. This indicates that the ‘safe potential window’ may not be applicable in vivo, as no damage was done stimulating with 20 mA at 200 Hz, while damage was done using the same current at 400 Hz.
Original languageEnglish
Title of host publicationProceedings of the 3rd International Congress on Neurotechnology, Electronics and Informatics, NEUROTECHNIX 2015, 16-17 November 2015, Lisbon, Portugal
PublisherSCITEPRESS Digital Library
Publication date2015
Pages101-105
ISBN (Print)978-989-758-161-8
DOIs
Publication statusPublished - 2015
EventInternational Congress on Neurotechnology, Electronics and Informatics, NEUROTECHNIX - Lisbon, Portugal
Duration: 16 Nov 201517 Nov 2015
Conference number: 3

Conference

ConferenceInternational Congress on Neurotechnology, Electronics and Informatics, NEUROTECHNIX
Number3
CountryPortugal
CityLisbon
Period16/11/201517/11/2015

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