Image processing for drift compensation in fluorescence microscopy

Steffen B. Petersen, Thiagarajan Viruthachalam, Isabel Coutinho, Gnana P. Gajula, Maria Teresa Neves-Petersen

Research output: Contribution to book/anthology/report/conference proceeding › Conference abstract in proceeding › Research › peer-review

3 Citations (Scopus)

Original language	English
Title of host publication	Technical Summaries, 2013 BiOS, SPIE Photonics West, 2-7 February 2013, San Francisco, CA, USA
Publisher	SPIE - International Society for Optical Engineering
Publication date	2013
Pages	355, No. 8587-53
Publication status	Published - 2013
Event	SPIE Photonics West Conference, BiOS Session - San Francisco, CA, United States Duration: 2 Feb 2013 → 7 Feb 2013

Conference	SPIE Photonics West Conference, BiOS Session
Country/Territory	United States
City	San Francisco, CA
Period	02/02/2013 → 07/02/2013

Access to Document

Petersen, S. B., Viruthachalam, T., Coutinho, I., Gajula, G. P., & Neves-Petersen, M. T. (2013). Image processing for drift compensation in fluorescence microscopy. In Technical Summaries, 2013 BiOS, SPIE Photonics West, 2-7 February 2013, San Francisco, CA, USA (pp. 355, No. 8587-53). SPIE - International Society for Optical Engineering. http://spie.org/Documents/ConferencesExhibitions/PW13B-Abstracts.pdf

@inbook{0a7a1e031d1d4b2db489e136b4ddfa81,

title = "Image processing for drift compensation in fluorescence microscopy",

author = "Petersen, {Steffen B.} and Thiagarajan Viruthachalam and Isabel Coutinho and Gajula, {Gnana P.} and Neves-Petersen, {Maria Teresa}",

year = "2013",

language = "English",

pages = "355, No. 8587--53",

booktitle = "Technical Summaries, 2013 BiOS, SPIE Photonics West, 2-7 February 2013, San Francisco, CA, USA",

publisher = "SPIE - International Society for Optical Engineering",

address = "United States",

note = "SPIE Photonics West Conference, BiOS Session ; Conference date: 02-02-2013 Through 07-02-2013",

}

Petersen, SB, Viruthachalam, T, Coutinho, I, Gajula, GP & Neves-Petersen, MT 2013, Image processing for drift compensation in fluorescence microscopy. in Technical Summaries, 2013 BiOS, SPIE Photonics West, 2-7 February 2013, San Francisco, CA, USA. SPIE - International Society for Optical Engineering, pp. 355, No. 8587-53, SPIE Photonics West Conference, BiOS Session, San Francisco, CA, United States, 02/02/2013. <http://spie.org/Documents/ConferencesExhibitions/PW13B-Abstracts.pdf>

Image processing for drift compensation in fluorescence microscopy. / Petersen, Steffen B.; Viruthachalam, Thiagarajan; Coutinho, Isabel et al.
Technical Summaries, 2013 BiOS, SPIE Photonics West, 2-7 February 2013, San Francisco, CA, USA. SPIE - International Society for Optical Engineering, 2013. p. 355, No. 8587-53.

Research output: Contribution to book/anthology/report/conference proceeding › Conference abstract in proceeding › Research › peer-review

TY - ABST

T1 - Image processing for drift compensation in fluorescence microscopy

AU - Petersen, Steffen B.

AU - Viruthachalam, Thiagarajan

AU - Coutinho, Isabel

AU - Gajula, Gnana P.

AU - Neves-Petersen, Maria Teresa

PY - 2013

Y1 - 2013

M3 - Conference abstract in proceeding

SP - 355, No. 8587-53

BT - Technical Summaries, 2013 BiOS, SPIE Photonics West, 2-7 February 2013, San Francisco, CA, USA

PB - SPIE - International Society for Optical Engineering

T2 - SPIE Photonics West Conference, BiOS Session

Y2 - 2 February 2013 through 7 February 2013

ER -