Impact of Kelvin-Source Resistors on Current Sharing and Failure Detection in Multichip Power Modules

Nick Baker, Francesco Iannuzzo, Helong Li

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

12 Citations (Scopus)
547 Downloads (Pure)

Abstract

The use of a kelvin-source (sometimes referred to as an auxiliary-source) terminal is becoming common in fast switching semiconductors such as Silicon Carbide MOSFETs. The kelvin-source terminal decouples the path of the load current from the path of the control current, leading to improved switching characteristics. However, in multiple paralleled chips, kelvin-source connections sometimes lead to load current imbalances among the bondwires of each paralleled chip. A simple method to prevent this is to introduce kelvin-source resistors. This paper investigates the sizing of kelvin-source resistors and their subsequent impact on current balancing. This investigation has primarily been conducted in the context of using the kelvin-source resistor as a failure detection sensor. We find that a kelvin-source resistor of 0.5Ω to 1Ω is adequate for current balancing purposes, however for dual purpose use as a failure sensor, a value of 2Ω or more may be recommended.
Original languageEnglish
Title of host publicationProceedings of the 2018 20th European Conference on Power Electronics and Applications, EPE'18 ECCE Europe
Number of pages7
PublisherIEEE Press
Publication dateSept 2018
Pages1-7
Article number8515541
ISBN (Print)978-1-5386-4145-3
ISBN (Electronic)978-9-0758-1528-3
Publication statusPublished - Sept 2018
Event20th European Conference on Power Electronics and Applications, EPE 2018 ECCE Europe - Riga, Latvia
Duration: 17 Sept 201821 Sept 2018

Conference

Conference20th European Conference on Power Electronics and Applications, EPE 2018 ECCE Europe
Country/TerritoryLatvia
CityRiga
Period17/09/201821/09/2018

Keywords

  • Packaging
  • Power Semiconductor Device
  • Reliability

Fingerprint

Dive into the research topics of 'Impact of Kelvin-Source Resistors on Current Sharing and Failure Detection in Multichip Power Modules'. Together they form a unique fingerprint.

Cite this