TY - GEN
T1 - Impact of Long-Term Mission Profile Sampling Rate on the Reliability Evaluation of Power Electronics in Photovoltaic Applications
AU - Vernica, Ionut
AU - Wang, Huai
AU - Blaabjerg, Frede
PY - 2018/9
Y1 - 2018/9
N2 - Due to the increased cost, and time-demanding approach of conventional reliability improvement procedures, the transition towards model-based reliability assessment of power electronics becomes more and more crucial. Although important steps have been taken in this direction, the resulting lifetime prediction is still subject to different assumptions and uncertainties (e.g. mission profile data, modeling errors, lifetime models, etc.), Thus, this paper aims at investigating and quantifying the impact of the mission profile resolution on the reliability estimation of power IGBT modules and DC-link capacitors. For a 10 kW PV application case study, three mission profile sampling rates (1 minute/data, 30 minutes/data, and 60 minutes/data) are considered and benchmarked, with respect to the predicted lifetime of the power electronic components/system. Finally, an uncertainty analysis is performed for the resulting reliability metrics, and some initial guidelines for mission profile resolution selection are provided.
AB - Due to the increased cost, and time-demanding approach of conventional reliability improvement procedures, the transition towards model-based reliability assessment of power electronics becomes more and more crucial. Although important steps have been taken in this direction, the resulting lifetime prediction is still subject to different assumptions and uncertainties (e.g. mission profile data, modeling errors, lifetime models, etc.), Thus, this paper aims at investigating and quantifying the impact of the mission profile resolution on the reliability estimation of power IGBT modules and DC-link capacitors. For a 10 kW PV application case study, three mission profile sampling rates (1 minute/data, 30 minutes/data, and 60 minutes/data) are considered and benchmarked, with respect to the predicted lifetime of the power electronic components/system. Finally, an uncertainty analysis is performed for the resulting reliability metrics, and some initial guidelines for mission profile resolution selection are provided.
KW - Mission profile resolution
KW - Power IGBT module
KW - DC-link capacitor
KW - System-level reliability
KW - Uncertainty analysis
U2 - 10.1109/ECCE.2018.8558092
DO - 10.1109/ECCE.2018.8558092
M3 - Article in proceeding
SN - 978-1-4799-7313-2
T3 - IEEE Energy Conversion Congress and Exposition
SP - 4078
EP - 4085
BT - Proceedings of the IEEE Energy Conversion Congress and Exposition (ECCE 2018)
PB - IEEE Press
CY - USA
T2 - 2018 IEEE Energy Conversion Congress and Exposition
Y2 - 23 September 2018 through 27 September 2018
ER -