Impact of Long-Term Mission Profile Sampling Rate on the Reliability Evaluation of Power Electronics in Photovoltaic Applications

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Abstract

Due to the increased cost, and time-demanding approach of conventional reliability improvement procedures, the transition towards model-based reliability assessment of power electronics becomes more and more crucial. Although important steps have been taken in this direction, the resulting lifetime prediction is still subject to different assumptions and uncertainties (e.g. mission profile data, modeling errors, lifetime models, etc.), Thus, this paper aims at investigating and quantifying the impact of the mission profile resolution on the reliability estimation of power IGBT modules and DC-link capacitors. For a 10 kW PV application case study, three mission profile sampling rates (1 minute/data, 30 minutes/data, and 60 minutes/data) are considered and benchmarked, with respect to the predicted lifetime of the power electronic components/system. Finally, an uncertainty analysis is performed for the resulting reliability metrics, and some initial guidelines for mission profile resolution selection are provided.
Original languageEnglish
Title of host publicationProceedings of the IEEE Energy Conversion Congress and Exposition (ECCE 2018)
Number of pages8
Place of PublicationUSA
PublisherIEEE Press
Publication dateSep 2018
Pages4078 - 4085
ISBN (Print)978-1-4799-7313-2
ISBN (Electronic)978-1-4799-7312-5
DOIs
Publication statusPublished - Sep 2018
Event 2018 IEEE Energy Conversion Congress and Exposition: ECCE - Portland, United States
Duration: 23 Sep 201827 Sep 2018

Conference

Conference 2018 IEEE Energy Conversion Congress and Exposition
Country/TerritoryUnited States
CityPortland
Period23/09/201827/09/2018
SeriesIEEE Energy Conversion Congress and Exposition
ISSN2329-3721

Keywords

  • Mission profile resolution
  • Power IGBT module
  • DC-link capacitor
  • System-level reliability
  • Uncertainty analysis

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