Impact of Short-Circuit Events on the Remaining Useful Life of SiC MOSFETs and Mitigation Strategy

He Du

Research output: PhD thesis

283 Downloads (Pure)
Original languageEnglish
Electronic ISBNs978-87-7210-841-4
Publication statusPublished - 2020

Bibliographical note

PhD supervisor:
Prof. Francesco Iannuzzo, Aalborg University, Denmark

Assistant PhD supervisor:
Dr. Paula Diaz Reigosa, University of Applied Sciences Northwestern Switzerland (FHNW), Switzerland


  • Silicon Carbide
  • Power MOSFET
  • Reliability
  • Short-Circuit
  • Failure Analysis
  • Power Cycling
  • Remaining Useful Life
  • Degradation

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