Impact of Short-Circuit Events on the Remaining Useful Life of SiC MOSFETs and Mitigation Strategy

He Du

Impact of Short-Circuit Events on the Remaining Useful Life of SiC MOSFETs and Mitigation Strategy

He Du

Research output: PhD thesis

306 Downloads (Pure)

Original language	English
Supervisors	Iannuzzo, Francesco, Principal supervisor Reigosa, Paula Diaz, Co-supervisor, External person
Publisher	Aalborg Universitetsforlag
Electronic ISBNs	978-87-7210-841-4
Publication status	Published - 2020

Bibliographical note

PhD supervisor:
Prof. Francesco Iannuzzo, Aalborg University, Denmark

Assistant PhD supervisor:
Dr. Paula Diaz Reigosa, University of Applied Sciences Northwestern Switzerland (FHNW), Switzerland

Keywords

Silicon Carbide
Power MOSFET
Reliability
Short-Circuit
Failure Analysis
Power Cycling
Remaining Useful Life
Degradation

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PHD_HD_E-pdfFinal published version, 14.2 MB

AUB Link

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4 Article in proceeding
4 Journal article
1 Conference article in Journal

A Mitigation Strategy for the Short-Circuit Degradation in SiC MOSFETs
Du, H. & Iannuzzo, F., 2020, IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia 2020. IEEE, p. 1-4 4 p. 9360256
Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research › peer-review

Open Access
File
3 Citations (Scopus)

46 Downloads (Pure)
Effect of short-circuit degradation on the remaining useful lifetime of SiC MOSFETs and its failure analysis
Du, H., Letz, S., Baker, N., Goetz, T., Iannuzzo, F. & Schletz, A., Nov 2020, In: Microelectronics Reliability. 114, p. 1-5 5 p., 113784.
Research output: Contribution to journal › Journal article › Research › peer-review

Open Access
File
10 Citations (Scopus)

57 Downloads (Pure)
Impact of Repetitive Short-Circuit Tests on the Normal Operation of SiC MOSFETs Considering Case Temperature Influence
Du, H., Reigosa, P. D., Ceccarelli, L. & Iannuzzo, F., Mar 2020, In: IEEE Journal of Emerging and Selected Topics in Power Electronics. 8, 1, p. 195-205 11 p., 8844745.
Research output: Contribution to journal › Journal article › Research › peer-review

Open Access
File
34 Citations (Scopus)

290 Downloads (Pure)

Cite this

@misc{265d050799a44f9183da97084a85bb79,

title = "Impact of Short-Circuit Events on the Remaining Useful Life of SiC MOSFETs and Mitigation Strategy",

keywords = "Silicon Carbide, Power MOSFET, Reliability, Short-Circuit, Failure Analysis, Power Cycling, Remaining Useful Life, Degradation",

author = "He Du",

note = "PhD supervisor: Prof. Francesco Iannuzzo, Aalborg University, Denmark Assistant PhD supervisor: Dr. Paula Diaz Reigosa, University of Applied Sciences Northwestern Switzerland (FHNW), Switzerland",

year = "2020",

language = "English",

series = "Ph.d.-serien for Det Ingeni{\o}r- og Naturvidenskabelige Fakultet, Aalborg Universitet",

publisher = "Aalborg Universitetsforlag",

}

TY - GEN

T1 - Impact of Short-Circuit Events on the Remaining Useful Life of SiC MOSFETs and Mitigation Strategy

AU - Du, He

N1 - PhD supervisor: Prof. Francesco Iannuzzo, Aalborg University, Denmark Assistant PhD supervisor: Dr. Paula Diaz Reigosa, University of Applied Sciences Northwestern Switzerland (FHNW), Switzerland

PY - 2020

Y1 - 2020

KW - Silicon Carbide

KW - Power MOSFET

KW - Reliability

KW - Short-Circuit

KW - Failure Analysis

KW - Power Cycling

KW - Remaining Useful Life

KW - Degradation

M3 - PhD thesis

T3 - Ph.d.-serien for Det Ingeniør- og Naturvidenskabelige Fakultet, Aalborg Universitet

PB - Aalborg Universitetsforlag

ER -

Impact of Short-Circuit Events on the Remaining Useful Life of SiC MOSFETs and Mitigation Strategy

Bibliographical note

Keywords

Access to Document

AUB Link

Research output

A Mitigation Strategy for the Short-Circuit Degradation in SiC MOSFETs

Effect of short-circuit degradation on the remaining useful lifetime of SiC MOSFETs and its failure analysis

Impact of Repetitive Short-Circuit Tests on the Normal Operation of SiC MOSFETs Considering Case Temperature Influence

Cite this