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Dive into the research topics of 'Impact of the Case Temperature on the Reliability of SiC MOSFETs Under Repetitive Short Circuit Tests'. Together they form a unique fingerprint.- Sort by
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He Du, Paula Diaz Reigosa, Francesco Iannuzzo, Lorenzo Ceccarelli
Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research › peer-review