Impact of the Case Temperature on the Reliability of SiC MOSFETs Under Repetitive Short Circuit Tests

He Du, Paula Diaz Reigosa, Francesco Iannuzzo, Lorenzo Ceccarelli

Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research › peer-review

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Center Of Reliable Power Electronics (CORPE)
Blaabjerg, F., Munk-Nielsen, S., Pedersen, K. & Popok, V.
01/04/2011 → 31/12/2016
Project: Research