Impact of the circulating current control on transient submodule voltage stresses for grid-tied modular multilevel converters during grid faults

Zhijian Yin*, Huan Qiu, Yongheng Yang, Yi Tang, Huai Wang

*Corresponding author

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

Abstract

The maximum sub-module (SM) voltage stress is a key parameter for the modular multilevel converter (MMC) design, e.g., IGBT voltage rating selection and SM capacitor sizing. For a grid-tied MMC, the evaluation of the SM voltage stress should consider the steady-state operation and also the dynamic performances, which are significantly dependent on the MMC control system. Thus, this paper proposes a mathematical approach based on a typical MMC control strategy to investigate the interaction between the SM voltage and the circulating current suppression control. The time domain expression of the transient SM voltage during grid faults is derived. To verify the model, a downscale three-phase MMC experimental platform has been built. Comparisons of the model estimation of the SM voltage dynamics and experimental results verify the effectiveness of the proposed model.
Original languageEnglish
Title of host publicationProceedings of 2019 IEEE Energy Conversion Congress and Exposition (ECCE)
Number of pages6
PublisherIEEE Press
Publication dateSep 2019
Pages5908-5913
Article number8912833
ISBN (Electronic)978-1-7281-0395-2
DOIs
Publication statusPublished - Sep 2019
Event2019 IEEE Energy Conversion Congress and Exposition (ECCE) - Baltimore, United States
Duration: 29 Sep 20193 Oct 2019

Conference

Conference2019 IEEE Energy Conversion Congress and Exposition (ECCE)
CountryUnited States
City Baltimore
Period29/09/201903/10/2019
SeriesIEEE Energy Conversion Congress and Exposition
ISSN2329-3721

Keywords

  • Circulating current control
  • Grid faults
  • Modular multilevel converter
  • Sub-module voltage stress

Fingerprint Dive into the research topics of 'Impact of the circulating current control on transient submodule voltage stresses for grid-tied modular multilevel converters during grid faults'. Together they form a unique fingerprint.

Cite this