Projects per year
Abstract
The reliability of the Modular Multilevel Converter (MMC) is of great interest in industrial applications, where the dominant failure mechanism of IGBT modules in an MMC system is temperature-related. In this regard, thermal modeling is critical to map the power losses to thermal profiles and then to predict the lifetime. Even though the Thermal Interface Materials (TIMs) in IGBT modules have a considerable influence on the thermal resistance, the thickness of TIMs is often spuriously considered as a constant according to the thermal conductivity or information in the datasheet. This may lead to misleading results in the lifetime prediction. Hence, this paper investigates the impact of the TIM thickness on the estimated lifetime of IGBT modules in an MMC system for offshore wind power applications, including the starting assembly thickness and the Bond-Line Thickness (BLT) of TIMs. In a 30-MW MMC case study, the lifetime of the IGBT modules is discussed with respect to two values of starting thickness and variable BLT from 20 μm to 60 μm. Experiments are also carried out on a scaled-down system to validate the impact of the TIM thicknesses on the reliability prediction.
Original language | English |
---|---|
Title of host publication | 2018 International Power Electronics Conference, IPEC-Niigata - ECCE Asia 2018 |
Number of pages | 7 |
Publisher | IEEE Press |
Publication date | 22 Oct 2018 |
Pages | 2743-2749 |
Article number | 8507408 |
ISBN (Print) | 978-1-5386-4190-3 |
ISBN (Electronic) | 978-4-88686-405-5 |
DOIs | |
Publication status | Published - 22 Oct 2018 |
Event | 8th International Power Electronics Conference, IPEC-Niigata - ECCE Asia 2018 - Niigata, Japan Duration: 20 May 2018 → 24 May 2018 |
Conference
Conference | 8th International Power Electronics Conference, IPEC-Niigata - ECCE Asia 2018 |
---|---|
Country/Territory | Japan |
City | Niigata |
Period | 20/05/2018 → 24/05/2018 |
Sponsor | IEEE Industry Applications Society (IAS), IEEE Power Electronics Society (PELS), IEEJ Industry Applications Society (IAS) |
Fingerprint
Dive into the research topics of 'Impact of the Thermal-Interface-Material Thickness on IGBT Module Reliability in the Modular Multilevel Converter'. Together they form a unique fingerprint.Projects
- 1 Finished
-
Center Of Reliable Power Electronics (CORPE)
Blaabjerg, F. (PI), Munk-Nielsen, S. (Project Participant), Pedersen, K. (Project Participant) & Popok, V. (Project Participant)
01/04/2011 → 31/12/2016
Project: Research
Activities
- 1 Conference organisation or participation
-
the International Power Electronics Conference, IPEC-Niigata 2018 -ECCE Asia
Wang, Z. (Participant)
20 May 2018 → 24 May 2018Activity: Attending an event › Conference organisation or participation
Research output
- 8 Citations
- 1 PhD thesis
-
Mission Profile Based Control and Reliability Improvement Strategies of Modular Multilevel Converters
Wang, Z., 2019, Aalborg Universitetsforlag. 111 p.Research output: PhD thesis
Open AccessFile