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Abstract
Modular Multilevel Converter (MMC) has recently become a popular multilevel topology for high-power applications, where the reliability performance is a crucial design consideration. In this paper the impacts of the circulating current in the MMC to the loss and thermal loading of power semiconductor devices are comprehensively investigated. Also a novel control strategy by utilizing the circulating current is proposed to enhance the reliability performance of MMC in order to limit the amplitude of thermal cycles. It is concluded that the circulating current may change the losses and thermal loading of the power devices, and by proper controlling the amount of circulating current, the temperature fluctuation or thermal cycling in the power device can be relieved, and thereby contributing to improved reliability performance according to many lifetime models/testing results for power devices.
Original language | English |
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Title of host publication | Proceedings of the 30th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2015 |
Number of pages | 7 |
Publisher | IEEE Press |
Publication date | Mar 2015 |
Pages | 2167-2173 |
ISBN (Print) | 978-1-4799-6735-3 |
DOIs | |
Publication status | Published - Mar 2015 |
Event | 30th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2015 - Charlotte, United States Duration: 15 Mar 2015 → 19 Mar 2015 |
Conference
Conference | 30th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2015 |
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Country/Territory | United States |
City | Charlotte |
Period | 15/03/2015 → 19/03/2015 |
Series | I E E E Applied Power Electronics Conference and Exposition. Conference Proceedings |
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ISSN | 1048-2334 |
Keywords
- Active Thermal Control
- Reliability
- Power Electronics
- Modular Multilevel Converter
- Circulating Current
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Dive into the research topics of 'Indirect thermal control for improved reliability of Modular Multilevel Converter by utilizing circulating current'. Together they form a unique fingerprint.Projects
- 1 Finished
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Center Of Reliable Power Electronics (CORPE)
Blaabjerg, F., Munk-Nielsen, S., Pedersen, K. & Popok, V.
01/04/2011 → 31/12/2016
Project: Research