Influence of photo-excited charge carriers in silicon wafer in a two-color laser-induced air plasma terahertz emission

Christian B. Sorensen, Leo Guiramand, A. Minasyan, C. Lacroix, Jerome Degert, Marc Tondusson, Esben Skovsen, Eric Freysz, Emmanuel Abraham

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

Abstract

We demonstrate that the far-field terahertz beam generated from a Ti:Sapphire two-color laser-induced filament can exhibit a conical or a Gaussian distribution depending on the filtering experimental conditions. Using a 2D electro-optic detection, we provide the first clear evidence that the conical emission in the 0.2-2.6 THz spectral range is due to photo-induced carriers in the silicon filter typically used to block the remaining pump laser light. The low-frequency terahertz beam retrieves an almost Gaussian spatial distribution when the silicon filter is preceded by a large bandgap ceramic filter, which stops the pump beam, preventing carriers generation in the silicon filter.

Original languageEnglish
Title of host publication2020 45th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2020
Number of pages2
PublisherIEEE
Publication date8 Nov 2020
Pages67-68
Article number9370560
ISBN (Print)978-1-7281-6621-6
ISBN (Electronic)978-1-7281-6620-9
DOIs
Publication statusPublished - 8 Nov 2020
Event45th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2020 - Virtual, Buffalo, United States
Duration: 8 Nov 202013 Nov 2020

Conference

Conference45th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2020
Country/TerritoryUnited States
CityVirtual, Buffalo
Period08/11/202013/11/2020
SponsorACST, et al., IEEE, Office of Naval Research Science and Technology (ONR), The Optical Society (OSA), University at Buffalo (UB)
SeriesInternational Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz
Volume2020-November
ISSN2162-2027

Bibliographical note

Publisher Copyright:
© 2020 IEEE.

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