Influence of Wave State Uncertainties on Probabilistic Reliability Assessments of Wave Energy Devices

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Abstract

Probabilistic reliability assessments of wave energy devices (WEDs) need to consider, among others, uncertainties related to the wave states, which are often defined by the significant wave height HS and the peak period TP or the mean crossing wave period TZ or the energy period Te. Based on the JONSWAP spectrum and white noise filtering, wave elevation time series are generated and uncertainties related to the wave states are estimated. In this paper, uncertainties regarding the time series length used to characterize a certain wave state, uncertainties related to the JONSWAP spectrum parameters and the influence on wave state discretization in a scatter diagram are assessed. The estimated uncertainties are then implemented in two generic structural reliability assessments with focus on fatigue and extreme failure modes. The resulting reliability indices are compared with related industries like offshore wind turbines. This paper focus on the Wavestar prototype for reliability assessments. This device is located at DanWEC in Hanstholm (DK).
Original languageEnglish
Title of host publication10th ewtec 2013 European Wave and Tidal Energy Conference Series : Proceedings of the 10th European Wave and Tidal Energy Conference
EditorsPeter Frigaard, Jens Peter Kofoed, AbuBakr S. Bahaj, Lars Bergdahl, Alain Clément, Daniel Conley, Antonio F. O. Falcão, Cameron MacLeod Johnstone, Lucia Margheritini, Ian Masters, António José Sarmento, Diego Vicinanza
Number of pages11
Place of PublicationAalborg
PublisherTechnical Committee of the European Wave and Tidal Energy Conference
Publication date2013
Publication statusPublished - 2013
EventEuropean Wave and Tidal Energy Conference - Aalborg, Denmark
Duration: 2 Sep 20135 Sep 2013
Conference number: 10

Conference

ConferenceEuropean Wave and Tidal Energy Conference
Number10
CountryDenmark
CityAalborg
Period02/09/201305/09/2013
SeriesEuropean Wave and Tidal Energy Conference Series
Number10

Bibliographical note

The proceedings is published on a usb.

Keywords

  • Extreme events
  • Fatigue
  • Reliability
  • Uncertainties
  • Wave Energy Device

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