Inherent Redundancy of SDBC-MMCC based STATCOM in the Overmodulation Region

D.C. Mendonça, A.F. Cupertino, H.A. Pereira, S.I. Seleme, R. Teodorescu

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

2 Citations (Scopus)

Abstract

The single delta bridge cell modular multilevel cascaded converter (SDBC-MMCC) has emerged as an interesting topology for Static Synchronous Compensator (STATCOM) applications. Since this converter is composed of tens/hundreds of components, reliability issues arise and redundant cells must be employed to fulfill the reliability requirements, increasing the initial cost of the STATCOM. In fact, there is a potential for fault tolerant operation when the overmodulation region is considered. This work aims to explore the inherent redundancy of SDBC-MMCC in the overmodulation region. Initially, the boundary conditions between linear and overmodulation region are analytically derived. Then, the inherent fault tolerance is evaluated based on 17 MVA/13.8 kV SDBC-MMCC based STATCOM case study with 24 cells per cluster. The results indicate that the converter is able to exchange rated power with the grid after 1 failure, with harmonic distortion within the limits suggested by the standards.
Original languageEnglish
Title of host publication2019 IEEE 15th Brazilian Power Electronics Conference and 5th IEEE Southern Power Electronics Conference (COBEP/SPEC)
Number of pages6
PublisherIEEE (Institute of Electrical and Electronics Engineers)
Publication dateDec 2019
Article number9065447
ISBN (Print)978-1-7281-4181-7
DOIs
Publication statusPublished - Dec 2019
Event2019 IEEE 15th Brazilian Power Electronics Conference and 5th IEEE Southern Power Electronics Conference (COBEP/SPEC) - Santos, Brazil
Duration: 1 Dec 20194 Dec 2019

Conference

Conference2019 IEEE 15th Brazilian Power Electronics Conference and 5th IEEE Southern Power Electronics Conference (COBEP/SPEC)
LocationSantos, Brazil
Period01/12/201904/12/2019
SeriesBrazilian Power Electronics Conference and Southern Power Electronics Conference (COBEP/SPEC)
ISSN2643-9778

Keywords

  • Automatic voltage control
  • Analytical models
  • Capacitors
  • Redundancy
  • Topology
  • Capacitance
  • Current control

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