Fingerprint
Dive into the research topics of 'Instabilities in silicon power devices: A review of failure mechanisms in modern power devices'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Instabilities in silicon power devices: A review of failure mechanisms in modern power devices
Francesco Iannuzzo*, Carmine Abbate, Giovanni Busatto
*Corresponding author for this work
Research output: Contribution to journal › Journal article › Research › peer-review
37
Citations
(Scopus)