Intrusiveness of Power Device Condition Monitoring Methods: Introducing Figures of Merit for Condition Monitoring

Santi Agatino Rizzo; Giovanni Susinni; Francesco Iannuzzo

doi:10.1109/MIE.2021.3066959

Intrusiveness of Power Device Condition Monitoring Methods: Introducing Figures of Merit for Condition Monitoring

Santi Agatino Rizzo, Giovanni Susinni, Francesco Iannuzzo

Research output: Contribution to journal › Journal article › Research › peer-review

12 Citations (Scopus)

31 Downloads (Pure)

Abstract

Power electronics is becoming pervasive in electricity-based applications, making power device reliability an increasingly important topic. Maintenance operations are necessary to ensure the functioning of power electronic apparatuses [1]. Guessing the time for maintenance operations is challenging due to the related tradeoff between maintenance costs and reliability improvements. Lifetime prediction techniques and condition monitoring methods (CMMs) are useful tools for determining the actual need [2].

Original language	English
Journal	IEEE Industrial Electronics Magazine
Volume	16
Issue number	1
Pages (from-to)	60-69
Number of pages	10
ISSN	1932-4529
DOIs	https://doi.org/10.1109/MIE.2021.3066959
Publication status	Published - 1 Mar 2022

Bibliographical note

Copyright:
Copyright 2021 Elsevier B.V., All rights reserved.

Keywords

Current measurement
Linearity
Logic gates
Sensors
Temperature measurement
Temperature sensors
Voltage measurement

Access to Document

10.1109/MIE.2021.3066959

IEEE_IEM_Intrusiveness_Power_Devices_Condition_Monitoring_acceptedAccepted author manuscript, 1.45 MB

AUB Link

Search for the material in Aalborg University Library's search engine

Cite this

@article{19b860f748c3404f9db2505f91c4fa77,

title = "Intrusiveness of Power Device Condition Monitoring Methods: Introducing Figures of Merit for Condition Monitoring",

abstract = "Power electronics is becoming pervasive in electricity-based applications, making power device reliability an increasingly important topic. Maintenance operations are necessary to ensure the functioning of power electronic apparatuses [1]. Guessing the time for maintenance operations is challenging due to the related tradeoff between maintenance costs and reliability improvements. Lifetime prediction techniques and condition monitoring methods (CMMs) are useful tools for determining the actual need [2]. ",

keywords = "Current measurement, Linearity, Logic gates, Sensors, Temperature measurement, Temperature sensors, Voltage measurement",

author = "Rizzo, {Santi Agatino} and Giovanni Susinni and Francesco Iannuzzo",

year = "2022",

month = mar,

day = "1",

doi = "10.1109/MIE.2021.3066959",

language = "English",

volume = "16",

pages = "60--69",

journal = "IEEE Industrial Electronics Magazine",

issn = "1932-4529",

publisher = "IEEE",

number = "1",

}

TY - JOUR

T1 - Intrusiveness of Power Device Condition Monitoring Methods

T2 - Introducing Figures of Merit for Condition Monitoring

AU - Rizzo, Santi Agatino

AU - Susinni, Giovanni

AU - Iannuzzo, Francesco

PY - 2022/3/1

Y1 - 2022/3/1

N2 - Power electronics is becoming pervasive in electricity-based applications, making power device reliability an increasingly important topic. Maintenance operations are necessary to ensure the functioning of power electronic apparatuses [1]. Guessing the time for maintenance operations is challenging due to the related tradeoff between maintenance costs and reliability improvements. Lifetime prediction techniques and condition monitoring methods (CMMs) are useful tools for determining the actual need [2].

AB - Power electronics is becoming pervasive in electricity-based applications, making power device reliability an increasingly important topic. Maintenance operations are necessary to ensure the functioning of power electronic apparatuses [1]. Guessing the time for maintenance operations is challenging due to the related tradeoff between maintenance costs and reliability improvements. Lifetime prediction techniques and condition monitoring methods (CMMs) are useful tools for determining the actual need [2].

KW - Current measurement

KW - Linearity

KW - Logic gates

KW - Sensors

KW - Temperature measurement

KW - Temperature sensors

KW - Voltage measurement

UR - http://www.scopus.com/inward/record.url?scp=85103883297&partnerID=8YFLogxK

U2 - 10.1109/MIE.2021.3066959

DO - 10.1109/MIE.2021.3066959

M3 - Journal article

AN - SCOPUS:85103883297

SN - 1932-4529

VL - 16

SP - 60

EP - 69

JO - IEEE Industrial Electronics Magazine

JF - IEEE Industrial Electronics Magazine

IS - 1

ER -

Intrusiveness of Power Device Condition Monitoring Methods: Introducing Figures of Merit for Condition Monitoring

Abstract

Bibliographical note

Keywords

Access to Document

AUB Link

Other files and links

Fingerprint

Cite this