Projects per year
Abstract
In this paper, the light emission of SiC MOSFETs during reverse conduction, caused by the Light Emission Diode (LED)-like behaviour of the body diode, is studied and investigated. The photoemission from a 1.2 kV/20 A commercial device has been measured experimentally using a silicon photodiode. A behavioural characterization of the light output under different junction temperatures and current values has been performed. This allows the implementation of a fast, inexpensive and non-invasive temperature sensing strategy for high-voltage SiC MOSFET chips based on the measurement of light emission during reverse conduction.
Original language | English |
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Journal | Microelectronics Reliability |
Volume | 88-90 |
Pages (from-to) | 627-630 |
Number of pages | 4 |
ISSN | 0026-2714 |
DOIs | |
Publication status | Published - Sept 2018 |
Event | 29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - AKKC, Aalborg, Denmark Duration: 1 Oct 2018 → 5 Oct 2018 Conference number: 29th http://www.esref2018conf.org/ |
Conference
Conference | 29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis |
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Number | 29th |
Location | AKKC |
Country/Territory | Denmark |
City | Aalborg |
Period | 01/10/2018 → 05/10/2018 |
Internet address |
Fingerprint
Dive into the research topics of 'Investigating SiC MOSFET body diode's light emission as temperature-sensitive electrical parameter'. Together they form a unique fingerprint.Projects
- 2 Finished
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APETT: Advanced Power Electronic Technology and Tools
Blaabjerg, F., Munk-Nielsen, S., Iannuzzo, F., Wang, H., Uhrenfeldt, C., Beczkowski, S. M., Zhou, D., Choi, U., Jørgensen, A. B., Vernica, I., Sangwongwanich, A., Christensen, N., Ceccarelli, L., Nielsen, C. K., Bahman, A. S., Pedersen, K., Pedersen, K. B. & Kristensen, P. K.
01/01/2017 → 30/06/2021
Project: Research
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Center Of Reliable Power Electronics (CORPE)
Blaabjerg, F., Munk-Nielsen, S., Pedersen, K. & Popok, V.
01/04/2011 → 31/12/2016
Project: Research
Activities
- 1 Conference organisation or participation
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29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
Lorenzo Ceccarelli (Participant)
1 Oct 2018 → 5 Oct 2018Activity: Attending an event › Conference organisation or participation