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Abstract
Insulated-gate bipolar transistor (IGBT) short-circuit failure modes have been under research for many years, successfully paving the way for device short-circuit ruggedness improvement. The aim of this paper is to classify and discuss recent contributions about IGBT short-circuit failure modes, in order to establish the current state of the art and trends in this area. First, the concept of 3-D safe operating area is proposed as the IGBT's operational boundary to divide the device short-circuit failure modes into short-circuit VDC/Vrated-ISC SOA limiting and short-circuit endurance time limiting groups. Then, the discussion is centered on currently reported IGBT short-circuit failure modes in terms of their relationships with the device 3-D short-circuit safe operating area (3D-SCSOA) characteristics. In addition, further investigation on the interaction of 3D-SCSOA characteristics is implemented to motivate advanced contributions in future dependence research of device short-circuit failure modes on temperature. Consequently, a comprehensive and thoughtful review of where the development of short-circuit failure mode research works of IGBT stands and is heading is provided.
Original language | English |
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Article number | 7878673 |
Journal | I E E E Transactions on Power Electronics |
Volume | 33 |
Issue number | 2 |
Pages (from-to) | 1075-1086 |
Number of pages | 12 |
ISSN | 0885-8993 |
DOIs | |
Publication status | Published - Feb 2018 |
Keywords
- High power insulated-gate bipolar transistors (IGBTs)
- Short-circuit failure mode
- Three-dimensional short-circuit safe operating area (3D-SCSOA)
- Self-heating
- Temperature dependence
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Dive into the research topics of 'Investigation and Classification of Short-Circuit Failure Modes Based on Three-Dimensional Safe Operating Area for High-Power IGBT Modules'. Together they form a unique fingerprint.Projects
- 1 Finished
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Center Of Reliable Power Electronics (CORPE)
Blaabjerg, F., Munk-Nielsen, S., Pedersen, K. & Popok, V.
01/04/2011 → 31/12/2016
Project: Research