Investigation on the degradation indicators of short-circuit tests in 1.2 kV SiC MOSFET power modules

He Du, Paula Diaz Reigosa, Francesco Iannuzzo, Lorenzo Ceccarelli

Research output: Contribution to journal › Conference article in Journal › Research › peer-review

10 Citations (Scopus)

205 Downloads (Pure)

10 Citations
1 PhD thesis

1 results

2020

Impact of Short-Circuit Events on the Remaining Useful Life of SiC MOSFETs and Mitigation Strategy
Du, H., 2020, Aalborg Universitetsforlag. 83 p.
Research output: PhD thesis

Open Access
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283 Downloads (Pure)