Issues of Impedance Emulation of Converter-Based Grid Emulator for LVRT Test

Zejie Li*, Fangzhou Zhao, Xingxing Chen, Stig Munk-Nielsen, Xiongfei Wang

*Corresponding author for this work

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

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A simultaneous change of voltage magnitude and grid impedance may occur during grid faults. To reproduce such impedance variation by converter-based grid emulators, the virtual impedance (VI) control and the virtual admittance (VA) control are two typical approaches. Their dynamics when used with the L-filtered grid emulator are evaluated in this paper. Two major issues, i.e., the inaccuracy of emulated low-frequency (< 50Hz) impedance by the VI control, and the adverse interactions between VA control and its inner current control. Simulation and experimental results of an L-filtered voltage source inverter confirm the correctness of analysis.

Original languageEnglish
Title of host publicationAPEC 2023 - 38th Annual IEEE Applied Power Electronics Conference and Exposition
Number of pages6
Publication date31 May 2023
ISBN (Print)978-1-6654-7540-2
ISBN (Electronic)978-1-6654-7539-6
Publication statusPublished - 31 May 2023
EventAPEC 2023 - Orlando
Duration: 19 Mar 202323 Mar 2023


ConferenceAPEC 2023


  • Transient impedance
  • low-voltage ride-through
  • virtual impedance
  • virtual admittance


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