Issues of Impedance Emulation of Converter-Based Grid Emulator for LVRT Test

Zejie Li; Fangzhou Zhao; Xingxing Chen; Stig Munk-Nielsen; Xiongfei Wang

doi:10.1109/APEC43580.2023.10131150

Issues of Impedance Emulation of Converter-Based Grid Emulator for LVRT Test

Zejie Li^*, Fangzhou Zhao, Xingxing Chen, Stig Munk-Nielsen, Xiongfei Wang

^*Corresponding author for this work

Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research › peer-review

2 Citations (Scopus)

40 Downloads (Pure)

Abstract

A simultaneous change of voltage magnitude and grid impedance may occur during grid faults. To reproduce such impedance variation by converter-based grid emulators, the virtual impedance (VI) control and the virtual admittance (VA) control are two typical approaches. Their dynamics when used with the L-filtered grid emulator are evaluated in this paper. Two major issues, i.e., the inaccuracy of emulated low-frequency (< 50Hz) impedance by the VI control, and the adverse interactions between VA control and its inner current control. Simulation and experimental results of an L-filtered voltage source inverter confirm the correctness of analysis.

Original language	English
Title of host publication	APEC 2023 - 38th Annual IEEE Applied Power Electronics Conference and Exposition
Number of pages	6
Publisher	IEEE
Publication date	31 May 2023
Pages	2741-2746
Article number	10131150
ISBN (Print)	978-1-6654-7540-2
ISBN (Electronic)	978-1-6654-7539-6
DOIs	https://doi.org/10.1109/APEC43580.2023.10131150
Publication status	Published - 31 May 2023
Event	38th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2023 - Orlando, United States Duration: 19 Mar 2023 → 23 Mar 2023

Conference

Conference	38th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2023
Country/Territory	United States
City	Orlando
Period	19/03/2023 → 23/03/2023
Sponsor	IEEE Industry Applications Society (IAS), IEEE Power Electronics Society (PELS), Power Sources Manufacturers Association (PSMA)

Series	I E E E Applied Power Electronics Conference and Exposition. Conference Proceedings
ISSN	1048-2334

Keywords

Transient impedance
low-voltage ride-through
virtual impedance
virtual admittance

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10.1109/APEC43580.2023.10131150

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Cite this

@inproceedings{b5edf6d46bb74f248b066a228c61f036,

title = "Issues of Impedance Emulation of Converter-Based Grid Emulator for LVRT Test",

abstract = "A simultaneous change of voltage magnitude and grid impedance may occur during grid faults. To reproduce such impedance variation by converter-based grid emulators, the virtual impedance (VI) control and the virtual admittance (VA) control are two typical approaches. Their dynamics when used with the L-filtered grid emulator are evaluated in this paper. Two major issues, i.e., the inaccuracy of emulated low-frequency (< 50Hz) impedance by the VI control, and the adverse interactions between VA control and its inner current control. Simulation and experimental results of an L-filtered voltage source inverter confirm the correctness of analysis.",

keywords = "Transient impedance, low-voltage ride-through, virtual impedance, virtual admittance",

author = "Zejie Li and Fangzhou Zhao and Xingxing Chen and Stig Munk-Nielsen and Xiongfei Wang",

year = "2023",

month = may,

day = "31",

doi = "10.1109/APEC43580.2023.10131150",

language = "English",

isbn = "978-1-6654-7540-2",

series = "I E E E Applied Power Electronics Conference and Exposition. Conference Proceedings",

publisher = "IEEE",

pages = "2741--2746",

booktitle = "APEC 2023 - 38th Annual IEEE Applied Power Electronics Conference and Exposition",

address = "United States",

note = "38th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2023 ; Conference date: 19-03-2023 Through 23-03-2023",

}

Li, Z , Zhao, F, Chen, X, Munk-Nielsen, S & Wang, X 2023, Issues of Impedance Emulation of Converter-Based Grid Emulator for LVRT Test. in APEC 2023 - 38th Annual IEEE Applied Power Electronics Conference and Exposition., 10131150, IEEE, I E E E Applied Power Electronics Conference and Exposition. Conference Proceedings, pp. 2741-2746, 38th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2023, Orlando, United States, 19/03/2023. https://doi.org/10.1109/APEC43580.2023.10131150

Issues of Impedance Emulation of Converter-Based Grid Emulator for LVRT Test. / Li, Zejie ; Zhao, Fangzhou; Chen, Xingxing et al.
APEC 2023 - 38th Annual IEEE Applied Power Electronics Conference and Exposition. IEEE, 2023. p. 2741-2746 10131150 (I E E E Applied Power Electronics Conference and Exposition. Conference Proceedings).

Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research › peer-review

TY - GEN

T1 - Issues of Impedance Emulation of Converter-Based Grid Emulator for LVRT Test

AU - Li, Zejie

AU - Zhao, Fangzhou

AU - Chen, Xingxing

AU - Munk-Nielsen, Stig

AU - Wang, Xiongfei

PY - 2023/5/31

Y1 - 2023/5/31

N2 - A simultaneous change of voltage magnitude and grid impedance may occur during grid faults. To reproduce such impedance variation by converter-based grid emulators, the virtual impedance (VI) control and the virtual admittance (VA) control are two typical approaches. Their dynamics when used with the L-filtered grid emulator are evaluated in this paper. Two major issues, i.e., the inaccuracy of emulated low-frequency (< 50Hz) impedance by the VI control, and the adverse interactions between VA control and its inner current control. Simulation and experimental results of an L-filtered voltage source inverter confirm the correctness of analysis.

AB - A simultaneous change of voltage magnitude and grid impedance may occur during grid faults. To reproduce such impedance variation by converter-based grid emulators, the virtual impedance (VI) control and the virtual admittance (VA) control are two typical approaches. Their dynamics when used with the L-filtered grid emulator are evaluated in this paper. Two major issues, i.e., the inaccuracy of emulated low-frequency (< 50Hz) impedance by the VI control, and the adverse interactions between VA control and its inner current control. Simulation and experimental results of an L-filtered voltage source inverter confirm the correctness of analysis.

KW - Transient impedance

KW - low-voltage ride-through

KW - virtual impedance

KW - virtual admittance

UR - http://www.scopus.com/inward/record.url?scp=85162261218&partnerID=8YFLogxK

U2 - 10.1109/APEC43580.2023.10131150

DO - 10.1109/APEC43580.2023.10131150

M3 - Article in proceeding

SN - 978-1-6654-7540-2

T3 - I E E E Applied Power Electronics Conference and Exposition. Conference Proceedings

SP - 2741

EP - 2746

BT - APEC 2023 - 38th Annual IEEE Applied Power Electronics Conference and Exposition

PB - IEEE

T2 - 38th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2023

Y2 - 19 March 2023 through 23 March 2023

ER -

Issues of Impedance Emulation of Converter-Based Grid Emulator for LVRT Test

Abstract

Conference

Keywords

Access to Document

AUB Link

Other files and links

Fingerprint

MODELING AND CONTROL OF SCALABLE VERSATILE GRID EMULATION SYSTEM

MERGE: Megawatt Scalable Versatile Grid Emulation System

Modeling and Control of Modular Multilevel Converter-Based Grid Emulators

Cite this

Issues of Impedance Emulation of Converter-Based Grid Emulator for LVRT Test

Abstract

Conference

Keywords

Access to Document

AUB Link

Other files and links

Fingerprint

Projects

MODELING AND CONTROL OF SCALABLE VERSATILE GRID EMULATION SYSTEM

MERGE: Megawatt Scalable Versatile Grid Emulation System

Research output

Modeling and Control of Modular Multilevel Converter-Based Grid Emulators

Cite this