TY - GEN
T1 - Lifetime Estimation and Reliability of PV Inverter with Multi-Timescale Thermal Stress Analysis
AU - Bouguerra, Sara
AU - Agroui, Kamel
AU - Gassab, Oussama
AU - Sangwongwanich, Ariya
AU - Blaabjerg, Frede
PY - 2019/8
Y1 - 2019/8
N2 - The reliability of the PV inverter is a critical issue because it is the less reliable component of the PV system. In order to lower the risks of failure and maintenance in PV systems, the factors that influence the PV inverter lifetime should be analyzed. Thermal stress is the main causes of IGBT failure in a PV inverter, which includes the fast cycling stress due to loss variations in an IGBT, and slow cycling due to mission profile fluctuations. In this paper, the design for reliability (DFR) approach based on mission profile analysis is used and demonstrated on a single phase, single stage, grid connected PV inverter installed in Algeria, where the lifetime is estimated by taking the effect of low frequency thermal cycling under long-term operation into consideration, in addition to the line frequency power cycling due to loss variations. The results reveal that low frequency thermal cycling have a significant impact on lifetime degradation and reliability of the PV inverter after many years of operation.
AB - The reliability of the PV inverter is a critical issue because it is the less reliable component of the PV system. In order to lower the risks of failure and maintenance in PV systems, the factors that influence the PV inverter lifetime should be analyzed. Thermal stress is the main causes of IGBT failure in a PV inverter, which includes the fast cycling stress due to loss variations in an IGBT, and slow cycling due to mission profile fluctuations. In this paper, the design for reliability (DFR) approach based on mission profile analysis is used and demonstrated on a single phase, single stage, grid connected PV inverter installed in Algeria, where the lifetime is estimated by taking the effect of low frequency thermal cycling under long-term operation into consideration, in addition to the line frequency power cycling due to loss variations. The results reveal that low frequency thermal cycling have a significant impact on lifetime degradation and reliability of the PV inverter after many years of operation.
KW - design for reliability
KW - Insulated-gate bipolar transistor
KW - mission profile
KW - Monte Carlo methods
KW - PV inverters
KW - reliability
KW - thermal loading
UR - http://www.scopus.com/inward/record.url?scp=85081553683&partnerID=8YFLogxK
U2 - 10.1109/ACEMP-OPTIM44294.2019.9007221
DO - 10.1109/ACEMP-OPTIM44294.2019.9007221
M3 - Article in proceeding
T3 - Optimization of Electrical and Electronic Equipment (OPTIM), Proceedings
SP - 402
EP - 408
BT - Proceedings 2019 International Aegean Conference on Electrical Machines and Power Electronics, ACEMP 2019 and 2019 International Conference on Optimization of Electrical and Electronic Equipment, OPTIM 2019
PB - IEEE
T2 - 2019 International Aegean Conference on Electrical Machines and Power Electronics, ACEMP 2019 and 2019 International Conference on Optimization of Electrical and Electronic Equipment, OPTIM 2019
Y2 - 27 August 2019 through 29 August 2019
ER -