Lifetime prediction of the film capacitor based on early degradation information

Yi Zhang; Zhongxu Wang; Shuai Zhao; Frede Blaabjerg; Huai Wang

doi:10.1109/APEC42165.2021.9487459

Lifetime prediction of the film capacitor based on early degradation information

Yi Zhang, Zhongxu Wang, Shuai Zhao, Frede Blaabjerg, Huai Wang

Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research › peer-review

1 Citation (Scopus)

Abstract

Long-term reliability testing time of power electronic components (e.g., film capacitors) entails delayed feedback of their performance, often many months to years, which has been one of critical limitations for accelerating power electronic technology development. In this paper, we explore a method to reduce the reliability testing time by exploiting capacitor's early-degradation information. In contrast to the conventional testing methods based on end-of-life (EOL) data alone, the proposed method makes more use of early degradation information in the reliability testing. The proposed method can predict the EOL lifetime of the film capacitor with 2.5% degradation testing only. The maximum error of the predicted result is less than 5% error compared to the conventional test-to-fail method. The proposed work serves as a first step to reduce the reliability testing time and accelerate the technology development of power electronics.

Original language	English
Title of host publication	2021 IEEE Applied Power Electronics Conference and Exposition, APEC 2021
Number of pages	6
Publisher	IEEE
Publication date	14 Jun 2021
Pages	407-412
ISBN (Print)	978-1-7281-8948-2, 978-1-7281-8950-5
ISBN (Electronic)	978-1-7281-8949-9
DOIs	https://doi.org/10.1109/APEC42165.2021.9487459
Publication status	Published - 14 Jun 2021
Event	36th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2021 - Virtual, Online, United States Duration: 14 Jun 2021 → 17 Jun 2021

Conference

Conference	36th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2021
Country/Territory	United States
City	Virtual, Online
Period	14/06/2021 → 17/06/2021
Sponsor	IEEE Industry Applications Society, IEEE Power Electronics Society, Power Sources Manufacturers Association

Series	I E E E Applied Power Electronics Conference and Exposition. Conference Proceedings
ISSN	1048-2334

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© 2021 IEEE.

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title = "Lifetime prediction of the film capacitor based on early degradation information",

abstract = "Long-term reliability testing time of power electronic components (e.g., film capacitors) entails delayed feedback of their performance, often many months to years, which has been one of critical limitations for accelerating power electronic technology development. In this paper, we explore a method to reduce the reliability testing time by exploiting capacitor's early-degradation information. In contrast to the conventional testing methods based on end-of-life (EOL) data alone, the proposed method makes more use of early degradation information in the reliability testing. The proposed method can predict the EOL lifetime of the film capacitor with 2.5% degradation testing only. The maximum error of the predicted result is less than 5% error compared to the conventional test-to-fail method. The proposed work serves as a first step to reduce the reliability testing time and accelerate the technology development of power electronics.",

author = "Yi Zhang and Zhongxu Wang and Shuai Zhao and Frede Blaabjerg and Huai Wang",

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series = "I E E E Applied Power Electronics Conference and Exposition. Conference Proceedings",

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Zhang, Y, Wang, Z, Zhao, S , Blaabjerg, F & Wang, H 2021, Lifetime prediction of the film capacitor based on early degradation information. in 2021 IEEE Applied Power Electronics Conference and Exposition, APEC 2021. IEEE, I E E E Applied Power Electronics Conference and Exposition. Conference Proceedings, pp. 407-412, 36th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2021, Virtual, Online, United States, 14/06/2021. https://doi.org/10.1109/APEC42165.2021.9487459

Lifetime prediction of the film capacitor based on early degradation information. / Zhang, Yi; Wang, Zhongxu; Zhao, Shuai et al.
2021 IEEE Applied Power Electronics Conference and Exposition, APEC 2021. IEEE, 2021. p. 407-412 (I E E E Applied Power Electronics Conference and Exposition. Conference Proceedings).

Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research › peer-review

TY - GEN

T1 - Lifetime prediction of the film capacitor based on early degradation information

AU - Zhang, Yi

AU - Wang, Zhongxu

AU - Zhao, Shuai

AU - Blaabjerg, Frede

AU - Wang, Huai

PY - 2021/6/14

Y1 - 2021/6/14

N2 - Long-term reliability testing time of power electronic components (e.g., film capacitors) entails delayed feedback of their performance, often many months to years, which has been one of critical limitations for accelerating power electronic technology development. In this paper, we explore a method to reduce the reliability testing time by exploiting capacitor's early-degradation information. In contrast to the conventional testing methods based on end-of-life (EOL) data alone, the proposed method makes more use of early degradation information in the reliability testing. The proposed method can predict the EOL lifetime of the film capacitor with 2.5% degradation testing only. The maximum error of the predicted result is less than 5% error compared to the conventional test-to-fail method. The proposed work serves as a first step to reduce the reliability testing time and accelerate the technology development of power electronics.

AB - Long-term reliability testing time of power electronic components (e.g., film capacitors) entails delayed feedback of their performance, often many months to years, which has been one of critical limitations for accelerating power electronic technology development. In this paper, we explore a method to reduce the reliability testing time by exploiting capacitor's early-degradation information. In contrast to the conventional testing methods based on end-of-life (EOL) data alone, the proposed method makes more use of early degradation information in the reliability testing. The proposed method can predict the EOL lifetime of the film capacitor with 2.5% degradation testing only. The maximum error of the predicted result is less than 5% error compared to the conventional test-to-fail method. The proposed work serves as a first step to reduce the reliability testing time and accelerate the technology development of power electronics.

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ER -

Lifetime prediction of the film capacitor based on early degradation information

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