Projects per year
Abstract
Considerable efforts have been made to estimate the lifetime of power devices, e.g., IGBTs, when they are subjected to a specific loading profile, which is affected by real field mission profiles. In those cases, a yearly mission profile, e.g., ambient temperatures, wind speeds and solar irradiance levels, is adopted. However, the prior art assumes that the same accumulated damage is caused in each year during the operation of the solutions. In practice the mission profile will vary, making the assumption invalid. This paper thus examines the assumption of equally distributed damage accumulation throughout the lifetime, by analyzing multiple years of mission profiles.
Original language | English |
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Title of host publication | 2020 22nd European Conference on Power Electronics and Applications, EPE 2020 ECCE Europe |
Number of pages | 10 |
Publisher | IEEE |
Publication date | Sept 2020 |
Pages | 1-10 |
Article number | 9215787 |
ISBN (Print) | 978-1-7281-9807-1 |
ISBN (Electronic) | 978-9-0758-1536-8 |
DOIs | |
Publication status | Published - Sept 2020 |
Event | 22nd European Conference on Power Electronics and Applications, EPE 2020 ECCE Europe - Lyon, France Duration: 7 Sept 2020 → 11 Sept 2020 |
Conference
Conference | 22nd European Conference on Power Electronics and Applications, EPE 2020 ECCE Europe |
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Country/Territory | France |
City | Lyon |
Period | 07/09/2020 → 11/09/2020 |
Series | 2020 22nd European Conference on Power Electronics and Applications, EPE 2020 ECCE Europe |
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Bibliographical note
Publisher Copyright:© 2020 EPE Association.
Copyright:
Copyright 2020 Elsevier B.V., All rights reserved.
Fingerprint
Dive into the research topics of 'Long-Term Climate Impact on IGBT Lifetime'. Together they form a unique fingerprint.Projects
- 1 Finished
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REPEPS: REliable Power Electronic based Power System
Blaabjerg, F., Iannuzzo, F., Davari, P., Wang, H., Wang, X. & Yang, Y.
01/08/2017 → 01/12/2023
Project: Research