Machine learning prediction of defect types for electroluminescence images of photovoltaic panels

Claire Mantel, Frederik Villebro, Gisele Alves dos Reis Benatto , Harsh Rajesh Parikh, Stefan Wendlandt, Kabir Hossain, Peter Poulsen, Sergiu Viorel Spataru, Dezso Séra, Søren Forchhammer

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

23 Citations (Scopus)
199 Downloads (Pure)

Abstract

Despite recent technological advances for Photovoltaic panels maintenance (Electroluminescence imaging, drone inspection), only few large-scale studies achieve identification of the precise category of defects or faults. In this work, Electroluminescence imaged modules are automatically split into cells using projections on the x and y axes to detect cell boundaries. Regions containing potential defects or faults are then detected using Hough transform combined with mathematical morphology. Care is taken to remove most of the bus bars or cell boundaries. Afterwards, 25 features are computed, focusing on both the geometry of the regions (e.g. area, perimeter, circularity) and the statistical characteristics of their pixel values (e.g. median, standard deviation, skewness). Finally, features are mapped to the ground truth labels with Support Vector Machine (RBF kernel) and Random Forest algorithms, coupled with undersampling and SMOTE oversampling, with a stratified 5- folds approach for cross validation. A dataset of 982 Electroluminescence images of installed multi-crystalline photovoltaic modules was acquired in outdoor conditions (evening) with a CMOS sensor. After automatic blur detection, 753 images or 47244 cells remain to evaluate faults. All images were evaluated by experts in PV fault detection that labelled: Finger failures, and three types of cracks based on their respective severity levels (A, B and C). Our results based on 6 data series, yield using Support Vector Machine an accuracy of 0.997 and a recall of 0.274. Improving the region detection process will most likely allow improving the performance.
Original languageEnglish
Title of host publicationProceedings of SPIE Optical Engineering + Applications : Applications of Machine Learning
EditorsMichael E. Zelinski, Tarek M. Taha, Jonathan Howe, Abdul A. S. Awwal, Khan M. Iftekharuddin
Number of pages9
PublisherSPIE - International Society for Optical Engineering
Publication dateSept 2019
Article number1113904
ISBN (Print)9781510629714
ISBN (Electronic)9781510629721
DOIs
Publication statusPublished - Sept 2019
EventSPIE OPTICAL ENGINEERING + APPLICATIONS - San Diego, United States
Duration: 11 Aug 201915 Aug 2019

Conference

ConferenceSPIE OPTICAL ENGINEERING + APPLICATIONS
Country/TerritoryUnited States
CitySan Diego
Period11/08/201915/08/2019
SeriesProceedings of SPIE, the International Society for Optical Engineering
Volume11139
ISSN0277-786X

Keywords

  • Automatic defect detection
  • Electroluminescence imaging
  • Machine learning
  • Photovoltaic panels

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