Microwave On-Wafer Characterization of Three-Port Devices using Shield-Based Test-Fixtures

T. E. Kolding; Michael Bohl Jenner; S. Laursen

Microwave On-Wafer Characterization of Three-Port Devices using Shield-Based Test-Fixtures

T. E. Kolding, Michael Bohl Jenner, S. Laursen

Department of Electronic Systems

Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research

Original language	English
Title of host publication	IEEE MTT-S International Microwave Symposium Digest, Phoenix, Arizona, USA, May 20-25, 2001
Publisher	IEEE Signal Processing Society
Publication date	2001
Pages	1535-1538
ISBN (Print)	0780365380
Publication status	Published - 2001
Event	Microwave On-Wafer Characterization of Three-Port Devices using Shield-Based Test-Fixtures - Duration: 19 May 2010 → …

Conference

Conference	Microwave On-Wafer Characterization of Three-Port Devices using Shield-Based Test-Fixtures
Period	19/05/2010 → …

AUB Link

Search for the material in Aalborg University Library's search engine

Cite this

@inproceedings{e51fced09c2d11db8ed6000ea68e967b,

title = "Microwave On-Wafer Characterization of Three-Port Devices using Shield-Based Test-Fixtures",

author = "Kolding, {T. E.} and Jenner, {Michael Bohl} and S. Laursen",

note = "Vol. 3, pp. 1535-1538; Microwave On-Wafer Characterization of Three-Port Devices using Shield-Based Test-Fixtures ; Conference date: 19-05-2010",

year = "2001",

language = "English",

isbn = "0780365380",

pages = "1535--1538",

booktitle = "IEEE MTT-S International Microwave Symposium Digest, Phoenix, Arizona, USA, May 20-25, 2001",

publisher = "IEEE Signal Processing Society",

address = "United States",

}

Kolding, TE, Jenner, MB & Laursen, S 2001, Microwave On-Wafer Characterization of Three-Port Devices using Shield-Based Test-Fixtures. in IEEE MTT-S International Microwave Symposium Digest, Phoenix, Arizona, USA, May 20-25, 2001. IEEE Signal Processing Society, pp. 1535-1538, Microwave On-Wafer Characterization of Three-Port Devices using Shield-Based Test-Fixtures, 19/05/2010.

Microwave On-Wafer Characterization of Three-Port Devices using Shield-Based Test-Fixtures. / Kolding, T. E.; Jenner, Michael Bohl; Laursen, S.
IEEE MTT-S International Microwave Symposium Digest, Phoenix, Arizona, USA, May 20-25, 2001. IEEE Signal Processing Society, 2001. p. 1535-1538.

Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research

TY - GEN

T1 - Microwave On-Wafer Characterization of Three-Port Devices using Shield-Based Test-Fixtures

AU - Kolding, T. E.

AU - Jenner, Michael Bohl

AU - Laursen, S.

N1 - Vol. 3, pp. 1535-1538

PY - 2001

Y1 - 2001

M3 - Article in proceeding

SN - 0780365380

SP - 1535

EP - 1538

BT - IEEE MTT-S International Microwave Symposium Digest, Phoenix, Arizona, USA, May 20-25, 2001

PB - IEEE Signal Processing Society

T2 - Microwave On-Wafer Characterization of Three-Port Devices using Shield-Based Test-Fixtures

Y2 - 19 May 2010

ER -