Mission Profile-based Accelerated Testing of DC-link Capacitors in Photovoltaic Inverters

Ariya Sangwongwanich; Yanfeng Shen; Andrii Chub; Elizaveta Liivik; Dmitri Vinnikov; Huai Wang; Frede Blaabjerg

doi:10.1109/APEC.2019.8721794

Mission Profile-based Accelerated Testing of DC-link Capacitors in Photovoltaic Inverters

Ariya Sangwongwanich, Yanfeng Shen, Andrii Chub, Elizaveta Liivik, Dmitri Vinnikov, Huai Wang, Frede Blaabjerg

Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research › peer-review

10 Citations (Scopus)

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Abstract

The dc-link capacitor is considered as a weak component in Photovoltaic (PV) inverter system and its reliability needs to be evaluated and tested during the product development. Conventional reliability testing methods do not consider the real operating conditions (e.g., mission profile) of the dc-link capacitor during the test. Therefore, the validation of the reliability performance of the dc-link capacitor under its mission profile is still a challenge. To address this issue, a new reliability testing concept for the dc-link capacitor in PV inverters is proposed in this paper. In contrast to the conventional method, the proposed reliability testing method realizes the test profile through the modification of the original mission profile (e.g., solar irradiance and ambient temperature) in order to maintain the test condition as close to the real application as possible. A certain acceleration factor is applied to the solar irradiance amplitude and the ambient temperature level during the mission profile modification in order to increase the thermal stress of the dc-link capacitor during test, and thereby effectively reduce the testing time. The results show that the testing time can be reduced to 2.5 % of the real field operation lifetime, if the solar irradiance amplitude is increased by 20 % and the ambient temperature is elevated to 75 °C.

Original language	English
Title of host publication	Proceedings of 2019 IEEE Annual Applied Power Electronics Conference and Exposition (APEC 2019)
Number of pages	8
Place of Publication	USA
Publisher	IEEE Press
Publication date	24 May 2019
Pages	2833-2840
Article number	8721794
ISBN (Print)	978-1-5386-8331-6
ISBN (Electronic)	978-1-5386-8330-9
DOIs	https://doi.org/10.1109/APEC.2019.8721794
Publication status	Published - 24 May 2019
Event	34th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2019 - Anaheim, United States Duration: 17 Mar 2019 → 21 Mar 2019

Conference

Conference	34th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2019
Country/Territory	United States
City	Anaheim
Period	17/03/2019 → 21/03/2019
Sponsor	IEEE Industry Applications Society (IAS), IEEE Power Electronics Society (PELS), Power Sources Manufacturers Association (PSMA)

Series	IEEE Applied Power Electronics Conference and Exposition (APEC)
ISSN	2470-6647

Keywords

Reliability
Accelerated testing
Mission profile
Capacitors
PV inverters

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10.1109/APEC.2019.8721794

PID5684331Submitted manuscript, 1.97 MB

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Cite this

Sangwongwanich, A., Shen, Y., Chub, A., Liivik, E., Vinnikov, D., Wang, H., & Blaabjerg, F. (2019). Mission Profile-based Accelerated Testing of DC-link Capacitors in Photovoltaic Inverters. In Proceedings of 2019 IEEE Annual Applied Power Electronics Conference and Exposition (APEC 2019) (pp. 2833-2840). Article 8721794 IEEE Press. https://doi.org/10.1109/APEC.2019.8721794

@inproceedings{4ba9b1f84caf43379b68a23939cc2ff6,

title = "Mission Profile-based Accelerated Testing of DC-link Capacitors in Photovoltaic Inverters",

abstract = "The dc-link capacitor is considered as a weak component in Photovoltaic (PV) inverter system and its reliability needs to be evaluated and tested during the product development. Conventional reliability testing methods do not consider the real operating conditions (e.g., mission profile) of the dc-link capacitor during the test. Therefore, the validation of the reliability performance of the dc-link capacitor under its mission profile is still a challenge. To address this issue, a new reliability testing concept for the dc-link capacitor in PV inverters is proposed in this paper. In contrast to the conventional method, the proposed reliability testing method realizes the test profile through the modification of the original mission profile (e.g., solar irradiance and ambient temperature) in order to maintain the test condition as close to the real application as possible. A certain acceleration factor is applied to the solar irradiance amplitude and the ambient temperature level during the mission profile modification in order to increase the thermal stress of the dc-link capacitor during test, and thereby effectively reduce the testing time. The results show that the testing time can be reduced to 2.5 % of the real field operation lifetime, if the solar irradiance amplitude is increased by 20 % and the ambient temperature is elevated to 75 °C.",

keywords = "Reliability, Accelerated testing, Mission profile, Capacitors, PV inverters",

author = "Ariya Sangwongwanich and Yanfeng Shen and Andrii Chub and Elizaveta Liivik and Dmitri Vinnikov and Huai Wang and Frede Blaabjerg",

year = "2019",

month = may,

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doi = "10.1109/APEC.2019.8721794",

language = "English",

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series = "IEEE Applied Power Electronics Conference and Exposition (APEC)",

publisher = "IEEE Press",

pages = "2833--2840",

booktitle = "Proceedings of 2019 IEEE Annual Applied Power Electronics Conference and Exposition (APEC 2019)",

note = "34th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2019 ; Conference date: 17-03-2019 Through 21-03-2019",

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Sangwongwanich, A, Shen, Y, Chub, A, Liivik, E, Vinnikov, D, Wang, H & Blaabjerg, F 2019, Mission Profile-based Accelerated Testing of DC-link Capacitors in Photovoltaic Inverters. in Proceedings of 2019 IEEE Annual Applied Power Electronics Conference and Exposition (APEC 2019)., 8721794, IEEE Press, USA, IEEE Applied Power Electronics Conference and Exposition (APEC), pp. 2833-2840, 34th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2019, Anaheim, United States, 17/03/2019. https://doi.org/10.1109/APEC.2019.8721794

Mission Profile-based Accelerated Testing of DC-link Capacitors in Photovoltaic Inverters. / Sangwongwanich, Ariya; Shen, Yanfeng; Chub, Andrii et al.
Proceedings of 2019 IEEE Annual Applied Power Electronics Conference and Exposition (APEC 2019). USA: IEEE Press, 2019. p. 2833-2840 8721794 (IEEE Applied Power Electronics Conference and Exposition (APEC)).

Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research › peer-review

TY - GEN

T1 - Mission Profile-based Accelerated Testing of DC-link Capacitors in Photovoltaic Inverters

AU - Sangwongwanich, Ariya

AU - Shen, Yanfeng

AU - Chub, Andrii

AU - Liivik, Elizaveta

AU - Vinnikov, Dmitri

AU - Wang, Huai

AU - Blaabjerg, Frede

PY - 2019/5/24

Y1 - 2019/5/24

N2 - The dc-link capacitor is considered as a weak component in Photovoltaic (PV) inverter system and its reliability needs to be evaluated and tested during the product development. Conventional reliability testing methods do not consider the real operating conditions (e.g., mission profile) of the dc-link capacitor during the test. Therefore, the validation of the reliability performance of the dc-link capacitor under its mission profile is still a challenge. To address this issue, a new reliability testing concept for the dc-link capacitor in PV inverters is proposed in this paper. In contrast to the conventional method, the proposed reliability testing method realizes the test profile through the modification of the original mission profile (e.g., solar irradiance and ambient temperature) in order to maintain the test condition as close to the real application as possible. A certain acceleration factor is applied to the solar irradiance amplitude and the ambient temperature level during the mission profile modification in order to increase the thermal stress of the dc-link capacitor during test, and thereby effectively reduce the testing time. The results show that the testing time can be reduced to 2.5 % of the real field operation lifetime, if the solar irradiance amplitude is increased by 20 % and the ambient temperature is elevated to 75 °C.

AB - The dc-link capacitor is considered as a weak component in Photovoltaic (PV) inverter system and its reliability needs to be evaluated and tested during the product development. Conventional reliability testing methods do not consider the real operating conditions (e.g., mission profile) of the dc-link capacitor during the test. Therefore, the validation of the reliability performance of the dc-link capacitor under its mission profile is still a challenge. To address this issue, a new reliability testing concept for the dc-link capacitor in PV inverters is proposed in this paper. In contrast to the conventional method, the proposed reliability testing method realizes the test profile through the modification of the original mission profile (e.g., solar irradiance and ambient temperature) in order to maintain the test condition as close to the real application as possible. A certain acceleration factor is applied to the solar irradiance amplitude and the ambient temperature level during the mission profile modification in order to increase the thermal stress of the dc-link capacitor during test, and thereby effectively reduce the testing time. The results show that the testing time can be reduced to 2.5 % of the real field operation lifetime, if the solar irradiance amplitude is increased by 20 % and the ambient temperature is elevated to 75 °C.

KW - Reliability

KW - Accelerated testing

KW - Mission profile

KW - Capacitors

KW - PV inverters

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DO - 10.1109/APEC.2019.8721794

M3 - Article in proceeding

SN - 978-1-5386-8331-6

T3 - IEEE Applied Power Electronics Conference and Exposition (APEC)

SP - 2833

EP - 2840

BT - Proceedings of 2019 IEEE Annual Applied Power Electronics Conference and Exposition (APEC 2019)

PB - IEEE Press

CY - USA

T2 - 34th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2019

Y2 - 17 March 2019 through 21 March 2019

ER -

Sangwongwanich A, Shen Y, Chub A, Liivik E, Vinnikov D, Wang H et al. Mission Profile-based Accelerated Testing of DC-link Capacitors in Photovoltaic Inverters. In Proceedings of 2019 IEEE Annual Applied Power Electronics Conference and Exposition (APEC 2019). USA: IEEE Press. 2019. p. 2833-2840. 8721794. (IEEE Applied Power Electronics Conference and Exposition (APEC)). doi: 10.1109/APEC.2019.8721794

Mission Profile-based Accelerated Testing of DC-link Capacitors in Photovoltaic Inverters

Abstract

Conference

Keywords

Access to Document

AUB Link

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REPEPS: REliable Power Electronic based Power System

APETT: Advanced Power Electronic Technology and Tools

Cite this

Mission Profile-based Accelerated Testing of DC-link Capacitors in Photovoltaic Inverters

Abstract

Conference

Keywords

Access to Document

AUB Link

Other files and links

Fingerprint

Projects

REPEPS: REliable Power Electronic based Power System

APETT: Advanced Power Electronic Technology and Tools

Cite this