Mission profile resolution impacts on the thermal stress and reliability of power devices in PV inverters

A. Sangwongwanich*, D. Zhou, E. Liivik, F. Blaabjerg

*Corresponding author for this work

Research output: Contribution to journalConference article in JournalResearchpeer-review

18 Citations (Scopus)

Abstract

The operating conditions and reliability of Photovoltaic (PV) inverters are strongly affected by their mission profile. Since the mission profile of the PV system can vary considerably, the time-resolution of the mission profile becomes an important factor in the reliability prediction. In this paper, the impacts of mission profile resolutions on the reliability of the PV inverters are investigated. The results indicate that the mission profile resolution can deviate the reliability prediction considerably, especially during the fluctuating solar irradiance condition, and care must be taken during the reliability assessment.
Original languageEnglish
JournalMicroelectronics Reliability
Volume88-90
Pages (from-to)1003-1007
Number of pages5
ISSN0026-2714
DOIs
Publication statusPublished - Sept 2018
Event29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - AKKC, Aalborg, Denmark
Duration: 1 Oct 20185 Oct 2018
Conference number: 29th
http://www.esref2018conf.org/

Conference

Conference29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
Number29th
LocationAKKC
Country/TerritoryDenmark
CityAalborg
Period01/10/201805/10/2018
Internet address

Keywords

  • Mission profile
  • Photovoltaic systems
  • Power device
  • Power electronics
  • Reliability prediction
  • Sampling rate
  • Solar irradiance
  • Thermal stress

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