Modelling and experimental verification of tip-induced polarization in Kelvin probe force microscopy measurements on dielectric surfaces

Dennis Achton Nielsen, Vladimir Popok, Kjeld Pedersen

    Research output: Contribution to journalJournal articleResearchpeer-review

    2 Citations (Scopus)
    364 Downloads (Pure)

    Abstract

    Kelvin probe force microscopy is a widely used technique for measuring surface potential distributions on the micro- and nanometer scale. The data are, however, often analyzed qualitatively, especially for dielectrics. In many cases, the phenomenon of polarization and its influence on the measured signals is disregarded leading to misinterpretation of the results. In this work, we present a model that allows prediction of the surface potential on a metal/polymer
    heterostructure as measured by Kelvin probe force microscopy by including the tip-induced polarization of the dielectric that arises during measurement. The model is successfully verified using test samples.
    Original languageEnglish
    Article number195301
    JournalJournal of Applied Physics
    Volume118
    Issue number19
    Number of pages7
    ISSN0021-8979
    DOIs
    Publication statusPublished - 21 Nov 2015

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    microscopy
    probes
    polarization
    micrometers
    predictions
    metals

    Keywords

    • Kelvin probe force microscopy
    • dielectrics
    • polarization
    • surface electric potential

    Cite this

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    title = "Modelling and experimental verification of tip-induced polarization in Kelvin probe force microscopy measurements on dielectric surfaces",
    abstract = "Kelvin probe force microscopy is a widely used technique for measuring surface potential distributions on the micro- and nanometer scale. The data are, however, often analyzed qualitatively, especially for dielectrics. In many cases, the phenomenon of polarization and its influence on the measured signals is disregarded leading to misinterpretation of the results. In this work, we present a model that allows prediction of the surface potential on a metal/polymerheterostructure as measured by Kelvin probe force microscopy by including the tip-induced polarization of the dielectric that arises during measurement. The model is successfully verified using test samples.",
    keywords = "Kelvin probe force microscopy , dielectrics, polarization, surface electric potential",
    author = "Nielsen, {Dennis Achton} and Vladimir Popok and Kjeld Pedersen",
    year = "2015",
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    Modelling and experimental verification of tip-induced polarization in Kelvin probe force microscopy measurements on dielectric surfaces. / Nielsen, Dennis Achton; Popok, Vladimir; Pedersen, Kjeld.

    In: Journal of Applied Physics, Vol. 118, No. 19, 195301, 21.11.2015.

    Research output: Contribution to journalJournal articleResearchpeer-review

    TY - JOUR

    T1 - Modelling and experimental verification of tip-induced polarization in Kelvin probe force microscopy measurements on dielectric surfaces

    AU - Nielsen, Dennis Achton

    AU - Popok, Vladimir

    AU - Pedersen, Kjeld

    PY - 2015/11/21

    Y1 - 2015/11/21

    N2 - Kelvin probe force microscopy is a widely used technique for measuring surface potential distributions on the micro- and nanometer scale. The data are, however, often analyzed qualitatively, especially for dielectrics. In many cases, the phenomenon of polarization and its influence on the measured signals is disregarded leading to misinterpretation of the results. In this work, we present a model that allows prediction of the surface potential on a metal/polymerheterostructure as measured by Kelvin probe force microscopy by including the tip-induced polarization of the dielectric that arises during measurement. The model is successfully verified using test samples.

    AB - Kelvin probe force microscopy is a widely used technique for measuring surface potential distributions on the micro- and nanometer scale. The data are, however, often analyzed qualitatively, especially for dielectrics. In many cases, the phenomenon of polarization and its influence on the measured signals is disregarded leading to misinterpretation of the results. In this work, we present a model that allows prediction of the surface potential on a metal/polymerheterostructure as measured by Kelvin probe force microscopy by including the tip-induced polarization of the dielectric that arises during measurement. The model is successfully verified using test samples.

    KW - Kelvin probe force microscopy

    KW - dielectrics

    KW - polarization

    KW - surface electric potential

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    JO - Journal of Applied Physics

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