TY - JOUR
T1 - Modern IGBT gate driving methods for enhancing reliability of high-power converters - An overview
AU - Luo, Haoze
AU - Iannuzzo, Francesco
AU - Diaz Reigosa, Paula
AU - Blaabjerg, Frede
AU - Li, Wuhua
AU - He, Xiangning
PY - 2016
Y1 - 2016
N2 - This paper presents a survey of existing gate driving approaches for improving reliability of Insulated Gate Bipolar Transistors (IGBTs). An extensive and various lists of techniques are introduced and discussed, including fast detection, identification and protection against IGBT failures, also considering cost-effective solutions. Gate-driver circuit solutions to improve short-circuit robustness, overload, voltage and current overshoots withstanding capability are first introduced to cope with abnormal conditions severely affecting lifetime expectation. Later, some advanced, state-of-the-art control techniques are discussed to minimize the real-mission-profile stresses in terms of voltage and current stresses to the device, together with, not least, temperature variations. Future challenges and perspectives are finally discussed at the end of the paper.
AB - This paper presents a survey of existing gate driving approaches for improving reliability of Insulated Gate Bipolar Transistors (IGBTs). An extensive and various lists of techniques are introduced and discussed, including fast detection, identification and protection against IGBT failures, also considering cost-effective solutions. Gate-driver circuit solutions to improve short-circuit robustness, overload, voltage and current overshoots withstanding capability are first introduced to cope with abnormal conditions severely affecting lifetime expectation. Later, some advanced, state-of-the-art control techniques are discussed to minimize the real-mission-profile stresses in terms of voltage and current stresses to the device, together with, not least, temperature variations. Future challenges and perspectives are finally discussed at the end of the paper.
KW - Failure mechanisms
KW - IGBTs
KW - Intelligent gate driver
KW - Optimization methods and closed-loop control
KW - Protection methods
UR - http://www.scopus.com/inward/record.url?scp=84950137528&partnerID=8YFLogxK
U2 - 10.1016/j.microrel.2015.12.022
DO - 10.1016/j.microrel.2015.12.022
M3 - Journal article
AN - SCOPUS:84950137528
SN - 0026-2714
VL - 58
SP - 141
EP - 150
JO - Microelectronics Reliability
JF - Microelectronics Reliability
ER -