Monte Carlo Based Reliability Estimation Methods in Power Electronics

Mateja Novak; Ariya Sangwongwanich; Frede Blaabjerg

doi:10.1109/COMPEL49091.2020.9265685

Monte Carlo Based Reliability Estimation Methods in Power Electronics

Mateja Novak, Ariya Sangwongwanich, Frede Blaabjerg

Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research › peer-review

6 Citations (Scopus)

87 Downloads (Pure)

Abstract

In mission-profile based reliability assessments, it is a common method to calculate the static parameters that represent the thermal stress of power electronic converters. These parameters are afterwards used in Monte Carlo (MC) simulations for estimating the expected lifetime of the components in power converters taking into account variations. However, the static parameters do not always represent the real field operating conditions of the components in power converters. To overcome this limitation, two approaches to introduce a parameter variance are implemented in the dynamic mission profile characteristics used in MC simulations in this paper. In two different application cases, it is demonstrated that using static parameters can introduce a significant error in the MC simulation. For the photovoltaic (PV) inverter applications the lifetime of a semiconductor can be overestimated up to 30% if the static parameters are used, while for uninterrupted power supply (UPS) system applications this difference can reach almost 50%.

Original language	English
Title of host publication	2020 IEEE 21st Workshop on Control and Modeling for Power Electronics (COMPEL)
Number of pages	7
Publisher	IEEE Press
Publication date	Nov 2020
Pages	1-7
ISBN (Print)	978-1-7281-7161-6
ISBN (Electronic)	978-1-7281-7160-9
DOIs	https://doi.org/10.1109/COMPEL49091.2020.9265685
Publication status	Published - Nov 2020
Event	21th IEEE Workshop on Control and Modeling for Power Electronics, COMPEL 2020 - Aalborg, Denmark Duration: 9 Nov 2020 → 12 Nov 2020

Conference

Conference	21th IEEE Workshop on Control and Modeling for Power Electronics, COMPEL 2020
Country/Territory	Denmark
City	Aalborg
Period	09/11/2020 → 12/11/2020

Series	IEEE Workshop on Control and Modeling for Power Electronics (COMPEL)
ISSN	1093-5142

Keywords

converter reliability
Lifetime prediction
Mission profiles
Monte Carlo Method

Access to Document

10.1109/COMPEL49091.2020.9265685

PID6638027Accepted author manuscript, 1.55 MB

AUB Link

Search for the material in Aalborg University Library's search engine

REPEPS: REliable Power Electronic based Power System
Blaabjerg, F., Iannuzzo, F., Davari, P., Wang, H., Wang, X. & Yang, Y.
01/08/2017 → 01/12/2023
Project: Research

Cite this

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title = "Monte Carlo Based Reliability Estimation Methods in Power Electronics",

abstract = "In mission-profile based reliability assessments, it is a common method to calculate the static parameters that represent the thermal stress of power electronic converters. These parameters are afterwards used in Monte Carlo (MC) simulations for estimating the expected lifetime of the components in power converters taking into account variations. However, the static parameters do not always represent the real field operating conditions of the components in power converters. To overcome this limitation, two approaches to introduce a parameter variance are implemented in the dynamic mission profile characteristics used in MC simulations in this paper. In two different application cases, it is demonstrated that using static parameters can introduce a significant error in the MC simulation. For the photovoltaic (PV) inverter applications the lifetime of a semiconductor can be overestimated up to 30% if the static parameters are used, while for uninterrupted power supply (UPS) system applications this difference can reach almost 50%.",

keywords = "converter reliability, Lifetime prediction, Mission profiles, Monte Carlo Method",

author = "Mateja Novak and Ariya Sangwongwanich and Frede Blaabjerg",

year = "2020",

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publisher = "IEEE Press",

pages = "1--7",

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note = "21th IEEE Workshop on Control and Modeling for Power Electronics, COMPEL 2020 ; Conference date: 09-11-2020 Through 12-11-2020",

}

Novak, M , Sangwongwanich, A & Blaabjerg, F 2020, Monte Carlo Based Reliability Estimation Methods in Power Electronics. in 2020 IEEE 21st Workshop on Control and Modeling for Power Electronics (COMPEL). IEEE Press, IEEE Workshop on Control and Modeling for Power Electronics (COMPEL) , pp. 1-7, 21th IEEE Workshop on Control and Modeling for Power Electronics, COMPEL 2020, Aalborg, Denmark, 09/11/2020. https://doi.org/10.1109/COMPEL49091.2020.9265685

Monte Carlo Based Reliability Estimation Methods in Power Electronics. / Novak, Mateja ; Sangwongwanich, Ariya ; Blaabjerg, Frede.
2020 IEEE 21st Workshop on Control and Modeling for Power Electronics (COMPEL). IEEE Press, 2020. p. 1-7 (IEEE Workshop on Control and Modeling for Power Electronics (COMPEL) ).

Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research › peer-review

TY - GEN

T1 - Monte Carlo Based Reliability Estimation Methods in Power Electronics

AU - Novak, Mateja

AU - Sangwongwanich, Ariya

AU - Blaabjerg, Frede

PY - 2020/11

Y1 - 2020/11

N2 - In mission-profile based reliability assessments, it is a common method to calculate the static parameters that represent the thermal stress of power electronic converters. These parameters are afterwards used in Monte Carlo (MC) simulations for estimating the expected lifetime of the components in power converters taking into account variations. However, the static parameters do not always represent the real field operating conditions of the components in power converters. To overcome this limitation, two approaches to introduce a parameter variance are implemented in the dynamic mission profile characteristics used in MC simulations in this paper. In two different application cases, it is demonstrated that using static parameters can introduce a significant error in the MC simulation. For the photovoltaic (PV) inverter applications the lifetime of a semiconductor can be overestimated up to 30% if the static parameters are used, while for uninterrupted power supply (UPS) system applications this difference can reach almost 50%.

AB - In mission-profile based reliability assessments, it is a common method to calculate the static parameters that represent the thermal stress of power electronic converters. These parameters are afterwards used in Monte Carlo (MC) simulations for estimating the expected lifetime of the components in power converters taking into account variations. However, the static parameters do not always represent the real field operating conditions of the components in power converters. To overcome this limitation, two approaches to introduce a parameter variance are implemented in the dynamic mission profile characteristics used in MC simulations in this paper. In two different application cases, it is demonstrated that using static parameters can introduce a significant error in the MC simulation. For the photovoltaic (PV) inverter applications the lifetime of a semiconductor can be overestimated up to 30% if the static parameters are used, while for uninterrupted power supply (UPS) system applications this difference can reach almost 50%.

KW - converter reliability

KW - Lifetime prediction

KW - Mission profiles

KW - Monte Carlo Method

U2 - 10.1109/COMPEL49091.2020.9265685

DO - 10.1109/COMPEL49091.2020.9265685

M3 - Article in proceeding

SN - 978-1-7281-7161-6

T3 - IEEE Workshop on Control and Modeling for Power Electronics (COMPEL)

SP - 1

EP - 7

BT - 2020 IEEE 21st Workshop on Control and Modeling for Power Electronics (COMPEL)

PB - IEEE Press

T2 - 21th IEEE Workshop on Control and Modeling for Power Electronics, COMPEL 2020

Y2 - 9 November 2020 through 12 November 2020

ER -

Monte Carlo Based Reliability Estimation Methods in Power Electronics

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Keywords

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Projects

REPEPS: REliable Power Electronic based Power System

Cite this