Mutation-Based Test-Case Generation with Ecdar

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

9 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings - 10th IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2017
Number of pages10
PublisherIEEE
Publication date13 Apr 2017
Pages319-328
Article number7899077
ISBN (Electronic)9781509066766, 978-1-5090-6677-3
DOIs
Publication statusPublished - 13 Apr 2017
Event10th IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2017 - Tokyo, Japan
Duration: 13 Mar 201717 Mar 2017

Conference

Conference10th IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2017
CountryJapan
CityTokyo
Period13/03/201717/03/2017
SponsorAster, et al., IEEE, IEEE Computer Society, Japan Software Testing Qualifications Board (JSTQB), Waseda University

Keywords

  • Ecdar
  • Model-based Mutation Testing
  • Model-Based Testing
  • Test-Case Generation
  • Testing Strategies
  • Timed Automata
  • UPPAAL

Fingerprint Dive into the research topics of 'Mutation-Based Test-Case Generation with Ecdar'. Together they form a unique fingerprint.

  • Cite this

    Larsen, K. G., Lorber, F., Nielsen, B., & Nyman, U. M. (2017). Mutation-Based Test-Case Generation with Ecdar. In Proceedings - 10th IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2017 (pp. 319-328). [7899077] IEEE. https://doi.org/10.1109/ICSTW.2017.60