Abstract
Model-based testing is a well-known technique for automating the otherwise tedious process of testing. Test cases are automatically created from a formal model, according to some test criterion which determines when the test suite is complete. In model-based mutation testing, the test criterion is defined via faulty models, called mutants, which are used to create test cases that specifically target the modeled faults. To be able to reveal timing related faults, timed automata can be used as the test model. While model-based mutation testing has already been applied to timed automata, we show how to implement the technique more efficiently with the tool Ecdar, which belongs to the well-known UPPAAL tool family. The tool is used to perform an unbounded conformance check between the correct specification and the mutants, based on a notion of timed refinement. If a mutant does not refine the specification, Ecdar creates a strategy for reaching the non-conformance, which can be used as an adaptive test case. We applied the procedure to the timed automata model of a car alarm system, which was used in the previous approach of model-based mutation testing for timed automata, and compare the two approaches based on the results.
Original language | English |
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Title of host publication | Proceedings - 10th IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2017 |
Number of pages | 10 |
Publisher | IEEE (Institute of Electrical and Electronics Engineers) |
Publication date | 13 Apr 2017 |
Pages | 319-328 |
Article number | 7899077 |
ISBN (Electronic) | 9781509066766, 978-1-5090-6677-3 |
DOIs | |
Publication status | Published - 13 Apr 2017 |
Event | 10th IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2017 - Tokyo, Japan Duration: 13 Mar 2017 → 17 Mar 2017 |
Conference
Conference | 10th IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2017 |
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Country/Territory | Japan |
City | Tokyo |
Period | 13/03/2017 → 17/03/2017 |
Sponsor | Aster, et al., IEEE, IEEE Computer Society, Japan Software Testing Qualifications Board (JSTQB), Waseda University |
Keywords
- Ecdar
- Model-based Mutation Testing
- Model-Based Testing
- Test-Case Generation
- Testing Strategies
- Timed Automata
- UPPAAL